JPS5710467A - Terminal device for testing appliance - Google Patents

Terminal device for testing appliance

Info

Publication number
JPS5710467A
JPS5710467A JP8440380A JP8440380A JPS5710467A JP S5710467 A JPS5710467 A JP S5710467A JP 8440380 A JP8440380 A JP 8440380A JP 8440380 A JP8440380 A JP 8440380A JP S5710467 A JPS5710467 A JP S5710467A
Authority
JP
Japan
Prior art keywords
testing
terminal
terminals
state
time
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8440380A
Other languages
Japanese (ja)
Inventor
Toshio Nagame
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
YAMATAKE ENG SERVICE KK
YAMATAKE ENGINEERING SERVICE K
Original Assignee
YAMATAKE ENG SERVICE KK
YAMATAKE ENGINEERING SERVICE K
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by YAMATAKE ENG SERVICE KK, YAMATAKE ENGINEERING SERVICE K filed Critical YAMATAKE ENG SERVICE KK
Priority to JP8440380A priority Critical patent/JPS5710467A/en
Publication of JPS5710467A publication Critical patent/JPS5710467A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints

Abstract

PURPOSE:To perform testing a meter, wherein input is connected with the voltage signal source, in the state as it is attached and without removing wiring by using a field-effect transistor as an analog switch. CONSTITUTION:At a normal time of an appliance the terminals (a) and (c) of the terminal TT for testing are given the signals to drive the terminal TT for testing in the state of continuity while the terminals (b) and (d) of the terminal TT for testing are opened. At the time of testing a connector CN is inserted into the terminal TT and the terminals (a) and (c) of the terminal TT are given the signals to drive the FET in the noncontinuity state while the terminals (b) and (d) are connected with a voltage generator VG as the power source for testing. At the time of finishing the test the connector CN inserted into the terminal TT is taken out and after the space between the terminals (b) and (d) of the terminal TT for testing are opened the FET is transferred into the continuity state. Thereby the meter can be tested without removing wiring.
JP8440380A 1980-06-20 1980-06-20 Terminal device for testing appliance Pending JPS5710467A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8440380A JPS5710467A (en) 1980-06-20 1980-06-20 Terminal device for testing appliance

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8440380A JPS5710467A (en) 1980-06-20 1980-06-20 Terminal device for testing appliance

Publications (1)

Publication Number Publication Date
JPS5710467A true JPS5710467A (en) 1982-01-20

Family

ID=13829613

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8440380A Pending JPS5710467A (en) 1980-06-20 1980-06-20 Terminal device for testing appliance

Country Status (1)

Country Link
JP (1) JPS5710467A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6221067A (en) * 1985-07-19 1987-01-29 Koichi Yoshida Contact-type probe
US5021774A (en) * 1987-01-09 1991-06-04 Hitachi, Ltd. Method and circuit for scanning capacitive loads
CN106707847A (en) * 2016-11-30 2017-05-24 中国船舶重工集团公司第七六研究所 Mixed input signal quantity intelligent detection device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6221067A (en) * 1985-07-19 1987-01-29 Koichi Yoshida Contact-type probe
US5021774A (en) * 1987-01-09 1991-06-04 Hitachi, Ltd. Method and circuit for scanning capacitive loads
CN106707847A (en) * 2016-11-30 2017-05-24 中国船舶重工集团公司第七六研究所 Mixed input signal quantity intelligent detection device

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