JPS6484166A - Testing method for electronic circuit module - Google Patents
Testing method for electronic circuit moduleInfo
- Publication number
- JPS6484166A JPS6484166A JP62240619A JP24061987A JPS6484166A JP S6484166 A JPS6484166 A JP S6484166A JP 62240619 A JP62240619 A JP 62240619A JP 24061987 A JP24061987 A JP 24061987A JP S6484166 A JPS6484166 A JP S6484166A
- Authority
- JP
- Japan
- Prior art keywords
- module
- voltage
- measurement
- electronic circuit
- tested
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE:To automate the determination of the kind of an electronic circuit module to be tested by varying a DC power source from a low level to a high level with respect, to the electronic circuit module to be tested. CONSTITUTION:A terminal is selected first. Then a voltage which is high enough to operate the input/output module 2 to be tested and low enough not to damage the module is applied. This voltage is outputted to a contact point 11 from a testing device main body 1 and applied to the module 2 through a terminal screw 9. The response of the module 2 to the application of this low voltage is measured automatically to confirm whether or not the module 2 functions electrically. The measurement result is compared with reference data by kinds which are measured in advance and a kind is determined when coincidence is obtained. Then a function test is conducted. If it is found that there is no coincident kind as a result of the measurement, the polarity is inverted and measurement is performed again. When a coincident kind is found, the kind is determined. When not, the DC voltage is increased and applied to the module 2 and measurement is performed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62240619A JP2530664B2 (en) | 1987-09-28 | 1987-09-28 | Electronic circuit module test method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62240619A JP2530664B2 (en) | 1987-09-28 | 1987-09-28 | Electronic circuit module test method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6484166A true JPS6484166A (en) | 1989-03-29 |
JP2530664B2 JP2530664B2 (en) | 1996-09-04 |
Family
ID=17062190
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62240619A Expired - Lifetime JP2530664B2 (en) | 1987-09-28 | 1987-09-28 | Electronic circuit module test method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2530664B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5356313A (en) * | 1992-03-26 | 1994-10-18 | The Whitaker Corporation | Shielded electrical connector and mounting fixture therefor |
US5393234A (en) * | 1992-09-28 | 1995-02-28 | The Whitaker Corporation | Edge connectors and contacts used therein |
-
1987
- 1987-09-28 JP JP62240619A patent/JP2530664B2/en not_active Expired - Lifetime
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5356313A (en) * | 1992-03-26 | 1994-10-18 | The Whitaker Corporation | Shielded electrical connector and mounting fixture therefor |
US5393234A (en) * | 1992-09-28 | 1995-02-28 | The Whitaker Corporation | Edge connectors and contacts used therein |
Also Published As
Publication number | Publication date |
---|---|
JP2530664B2 (en) | 1996-09-04 |
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