JPS57127862A - Tester apparatus - Google Patents

Tester apparatus

Info

Publication number
JPS57127862A
JPS57127862A JP56013110A JP1311081A JPS57127862A JP S57127862 A JPS57127862 A JP S57127862A JP 56013110 A JP56013110 A JP 56013110A JP 1311081 A JP1311081 A JP 1311081A JP S57127862 A JPS57127862 A JP S57127862A
Authority
JP
Japan
Prior art keywords
resistance
measured
signal cable
receiving circuit
tests
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56013110A
Other languages
Japanese (ja)
Inventor
Ryozo Yoshino
Akira Yamagiwa
Takashi Matsumoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP56013110A priority Critical patent/JPS57127862A/en
Publication of JPS57127862A publication Critical patent/JPS57127862A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE:To enhance the repeating speed of tests eliminating reflection by inserting a resistance in series into a side end of an element to be measured of a signal cable while a receiving circuit aligned and terminated at a characteristic impedance and a driving circuit to the other end. CONSTITUTION:An output terminal 6 of an element 1 to be measured is connected to a series resistance 7 which is connected to a signal cable 2. The other end thereof 2 is connected to an input terminal and a terminaing resistance 8 of a receiving circuit 3 and output signals from the element 1 being measured is terminated correctly with terinating resistance 8 passing through the signal cable 2. Therefore, output voltage of the element given to the receiving circuit 3 is transmitted in a correct waveform free from the strain of the waveform due to reflection or the like. This can raise the repeating speed of tests while preventing over power because of appropriate load condition.
JP56013110A 1981-01-31 1981-01-31 Tester apparatus Pending JPS57127862A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56013110A JPS57127862A (en) 1981-01-31 1981-01-31 Tester apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56013110A JPS57127862A (en) 1981-01-31 1981-01-31 Tester apparatus

Publications (1)

Publication Number Publication Date
JPS57127862A true JPS57127862A (en) 1982-08-09

Family

ID=11824004

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56013110A Pending JPS57127862A (en) 1981-01-31 1981-01-31 Tester apparatus

Country Status (1)

Country Link
JP (1) JPS57127862A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5957175A (en) * 1982-09-27 1984-04-02 Fujitsu Ltd Measurement of integrated circuit
FR2692359A1 (en) * 1992-06-10 1993-12-17 Philips Electronique Lab Probe for taking electrical signals.

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5957175A (en) * 1982-09-27 1984-04-02 Fujitsu Ltd Measurement of integrated circuit
FR2692359A1 (en) * 1992-06-10 1993-12-17 Philips Electronique Lab Probe for taking electrical signals.

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