JPS5750666A - Testing device for function of circuit - Google Patents

Testing device for function of circuit

Info

Publication number
JPS5750666A
JPS5750666A JP55126692A JP12669280A JPS5750666A JP S5750666 A JPS5750666 A JP S5750666A JP 55126692 A JP55126692 A JP 55126692A JP 12669280 A JP12669280 A JP 12669280A JP S5750666 A JPS5750666 A JP S5750666A
Authority
JP
Japan
Prior art keywords
inspection
circuit
outputted
signals
ics1
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55126692A
Other languages
Japanese (ja)
Inventor
Kunimitsu Fujiki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP55126692A priority Critical patent/JPS5750666A/en
Publication of JPS5750666A publication Critical patent/JPS5750666A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE:To make the decision of non-defectives easy by detecting that the inspection signal from a pattern generating circuit for inspection is supplied to the inspection input terminals of the circuit group to be inspected and that the signals from the same output termianls of said group are the same at the function test for ICs or the like using digital signals as input and output signals. CONSTITUTION:The input pulse train from a pattern generating circuit PG is applied to the input terminals of circuits to be inspected, for example, ICs1-n to be measured. Of (m)-pieces of output pulse trains from the ICs1-n, (n)-pieces of the signals of the same terminals are applied to detecting circuits D1-m. If all of the ICs1-n are non-defective, ''1''s are outputted to all of the outputs of (m)-pieces of the detecting circuits, and if even one piece of defective is included, ''0''s are outputted to a number of these. Hence, when the results thereof are applied to a decision circuit H, for example, an OR circuit, a ''0'' is outputted if there are no defects and a ''1'' is outputted if there is any defective. Thereby, the inspection is possible in a short time with less time required for preparation for the inspection and the decision of non-defectives is easily accomplished.
JP55126692A 1980-09-12 1980-09-12 Testing device for function of circuit Pending JPS5750666A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55126692A JPS5750666A (en) 1980-09-12 1980-09-12 Testing device for function of circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55126692A JPS5750666A (en) 1980-09-12 1980-09-12 Testing device for function of circuit

Publications (1)

Publication Number Publication Date
JPS5750666A true JPS5750666A (en) 1982-03-25

Family

ID=14941478

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55126692A Pending JPS5750666A (en) 1980-09-12 1980-09-12 Testing device for function of circuit

Country Status (1)

Country Link
JP (1) JPS5750666A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS599761A (en) * 1982-07-07 1984-01-19 Nec Corp Diagnosing system of data processing device
JP2002107404A (en) * 2000-10-02 2002-04-10 Sony Corp Non-defective article determination method for cmos integrated circuit
WO2008044391A1 (en) * 2006-10-05 2008-04-17 Advantest Corporation Testing device, testing method, and manufacturing method
JP2011053180A (en) * 2009-09-04 2011-03-17 Fujitsu Ltd Circuit, tool, device and method for testing semiconductor

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS599761A (en) * 1982-07-07 1984-01-19 Nec Corp Diagnosing system of data processing device
JP2002107404A (en) * 2000-10-02 2002-04-10 Sony Corp Non-defective article determination method for cmos integrated circuit
WO2008044391A1 (en) * 2006-10-05 2008-04-17 Advantest Corporation Testing device, testing method, and manufacturing method
US8014969B2 (en) 2006-10-05 2011-09-06 Advantest Corporation Test apparatus, test method and manufacturing method
JP2011053180A (en) * 2009-09-04 2011-03-17 Fujitsu Ltd Circuit, tool, device and method for testing semiconductor

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