JPS53141582A - Character test system of semiconductor device - Google Patents
Character test system of semiconductor deviceInfo
- Publication number
- JPS53141582A JPS53141582A JP5622377A JP5622377A JPS53141582A JP S53141582 A JPS53141582 A JP S53141582A JP 5622377 A JP5622377 A JP 5622377A JP 5622377 A JP5622377 A JP 5622377A JP S53141582 A JPS53141582 A JP S53141582A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- test system
- character test
- character
- commodities
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE: To manufacture a testing device which displays the quality of characteristics on its display part by inputting a test signal to commodities to be tested in parallel and by comparatively discriminating the outputs with a reference signal.
COPYRIGHT: (C)1978,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5622377A JPS53141582A (en) | 1977-05-16 | 1977-05-16 | Character test system of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5622377A JPS53141582A (en) | 1977-05-16 | 1977-05-16 | Character test system of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS53141582A true JPS53141582A (en) | 1978-12-09 |
Family
ID=13021097
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5622377A Pending JPS53141582A (en) | 1977-05-16 | 1977-05-16 | Character test system of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS53141582A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5720674A (en) * | 1980-07-11 | 1982-02-03 | Toshiba Corp | Lsi tester |
JPS57125362A (en) * | 1981-01-28 | 1982-08-04 | Nec Corp | Testing device |
JPS57151874A (en) * | 1981-03-13 | 1982-09-20 | Nec Corp | Testing device for logic circuit |
JPH01170864A (en) * | 1987-12-25 | 1989-07-05 | Tokyo Electron Ltd | Tape carrier inspection method |
JPH08240639A (en) * | 1995-01-23 | 1996-09-17 | Fluke Corp | Method for automatic testing of semiconductor diode in electronic testing instrument and portable testing instrument |
-
1977
- 1977-05-16 JP JP5622377A patent/JPS53141582A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5720674A (en) * | 1980-07-11 | 1982-02-03 | Toshiba Corp | Lsi tester |
JPS57125362A (en) * | 1981-01-28 | 1982-08-04 | Nec Corp | Testing device |
JPS57151874A (en) * | 1981-03-13 | 1982-09-20 | Nec Corp | Testing device for logic circuit |
JPH01170864A (en) * | 1987-12-25 | 1989-07-05 | Tokyo Electron Ltd | Tape carrier inspection method |
JPH08240639A (en) * | 1995-01-23 | 1996-09-17 | Fluke Corp | Method for automatic testing of semiconductor diode in electronic testing instrument and portable testing instrument |
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