JPS53141582A - Character test system of semiconductor device - Google Patents

Character test system of semiconductor device

Info

Publication number
JPS53141582A
JPS53141582A JP5622377A JP5622377A JPS53141582A JP S53141582 A JPS53141582 A JP S53141582A JP 5622377 A JP5622377 A JP 5622377A JP 5622377 A JP5622377 A JP 5622377A JP S53141582 A JPS53141582 A JP S53141582A
Authority
JP
Japan
Prior art keywords
semiconductor device
test system
character test
character
commodities
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5622377A
Other languages
Japanese (ja)
Inventor
Seiji Takizawa
Takashi Sato
Chiaki Tachibana
Kazuo Hirobe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP5622377A priority Critical patent/JPS53141582A/en
Publication of JPS53141582A publication Critical patent/JPS53141582A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To manufacture a testing device which displays the quality of characteristics on its display part by inputting a test signal to commodities to be tested in parallel and by comparatively discriminating the outputs with a reference signal.
COPYRIGHT: (C)1978,JPO&Japio
JP5622377A 1977-05-16 1977-05-16 Character test system of semiconductor device Pending JPS53141582A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5622377A JPS53141582A (en) 1977-05-16 1977-05-16 Character test system of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5622377A JPS53141582A (en) 1977-05-16 1977-05-16 Character test system of semiconductor device

Publications (1)

Publication Number Publication Date
JPS53141582A true JPS53141582A (en) 1978-12-09

Family

ID=13021097

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5622377A Pending JPS53141582A (en) 1977-05-16 1977-05-16 Character test system of semiconductor device

Country Status (1)

Country Link
JP (1) JPS53141582A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5720674A (en) * 1980-07-11 1982-02-03 Toshiba Corp Lsi tester
JPS57125362A (en) * 1981-01-28 1982-08-04 Nec Corp Testing device
JPS57151874A (en) * 1981-03-13 1982-09-20 Nec Corp Testing device for logic circuit
JPH01170864A (en) * 1987-12-25 1989-07-05 Tokyo Electron Ltd Tape carrier inspection method
JPH08240639A (en) * 1995-01-23 1996-09-17 Fluke Corp Method for automatic testing of semiconductor diode in electronic testing instrument and portable testing instrument

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5720674A (en) * 1980-07-11 1982-02-03 Toshiba Corp Lsi tester
JPS57125362A (en) * 1981-01-28 1982-08-04 Nec Corp Testing device
JPS57151874A (en) * 1981-03-13 1982-09-20 Nec Corp Testing device for logic circuit
JPH01170864A (en) * 1987-12-25 1989-07-05 Tokyo Electron Ltd Tape carrier inspection method
JPH08240639A (en) * 1995-01-23 1996-09-17 Fluke Corp Method for automatic testing of semiconductor diode in electronic testing instrument and portable testing instrument

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