JPS57125362A - Testing device - Google Patents

Testing device

Info

Publication number
JPS57125362A
JPS57125362A JP56011224A JP1122481A JPS57125362A JP S57125362 A JPS57125362 A JP S57125362A JP 56011224 A JP56011224 A JP 56011224A JP 1122481 A JP1122481 A JP 1122481A JP S57125362 A JPS57125362 A JP S57125362A
Authority
JP
Japan
Prior art keywords
terminals
substances
testing
tested
information
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56011224A
Other languages
Japanese (ja)
Inventor
Yasushi Matsukawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP56011224A priority Critical patent/JPS57125362A/en
Publication of JPS57125362A publication Critical patent/JPS57125362A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE:To test plural substances to be tested suited only to the number of splitted terminals by splitting the number N of terminals into the plural number in the testing device such as an IC of the number N of terminals wherein it is possible to test one of the substances to be tested under the number N of terminals. CONSTITUTION:A test program for testing the substances to be tested is stored in the memory unit 2 to be sent to the bus processor 4 under control of the CPU1 in the direct memory access mode from the memory unit 2 through the measurement unit interface 3. When testing the plural number of substances to be tested, for instace, when testing two pieces of substances to be tested under 32 terminals, the test information in the case of testing one piece is used. When the sent information is to be set to the resister 6<0> or 6<1>, the bus processor sets the information to be set to the register 6<0> and 6<2> for the register 6<0> while for the register 6' the bus processor sets the information to be set to the register 6' and 6<3>. That is to say that the information to be set to the terminals 1-32 are set to the terminals 1-32 and simultaneously also to the terminals 33-64 so that the measurement unit 5 sets 2 pieces of the substances to be tested for testing.
JP56011224A 1981-01-28 1981-01-28 Testing device Pending JPS57125362A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56011224A JPS57125362A (en) 1981-01-28 1981-01-28 Testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56011224A JPS57125362A (en) 1981-01-28 1981-01-28 Testing device

Publications (1)

Publication Number Publication Date
JPS57125362A true JPS57125362A (en) 1982-08-04

Family

ID=11771982

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56011224A Pending JPS57125362A (en) 1981-01-28 1981-01-28 Testing device

Country Status (1)

Country Link
JP (1) JPS57125362A (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53141582A (en) * 1977-05-16 1978-12-09 Toshiba Corp Character test system of semiconductor device
JPS5421147A (en) * 1977-07-18 1979-02-17 Kyushu Nippon Electric Device for measuring ic

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53141582A (en) * 1977-05-16 1978-12-09 Toshiba Corp Character test system of semiconductor device
JPS5421147A (en) * 1977-07-18 1979-02-17 Kyushu Nippon Electric Device for measuring ic

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