JPS51132086A - Specific characteristics variation testing device - Google Patents
Specific characteristics variation testing deviceInfo
- Publication number
- JPS51132086A JPS51132086A JP5645375A JP5645375A JPS51132086A JP S51132086 A JPS51132086 A JP S51132086A JP 5645375 A JP5645375 A JP 5645375A JP 5645375 A JP5645375 A JP 5645375A JP S51132086 A JPS51132086 A JP S51132086A
- Authority
- JP
- Japan
- Prior art keywords
- specific characteristics
- testing device
- characteristics variation
- variation testing
- variation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
PURPOSE: To make it possible to detect the variation of specific characteristics of tested material automatically, not by eye sight.
COPYRIGHT: (C)1976,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5645375A JPS51132086A (en) | 1975-05-12 | 1975-05-12 | Specific characteristics variation testing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5645375A JPS51132086A (en) | 1975-05-12 | 1975-05-12 | Specific characteristics variation testing device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS51132086A true JPS51132086A (en) | 1976-11-16 |
Family
ID=13027514
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5645375A Pending JPS51132086A (en) | 1975-05-12 | 1975-05-12 | Specific characteristics variation testing device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS51132086A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54127286A (en) * | 1978-03-27 | 1979-10-03 | Hitachi Ltd | Drift-waveform check unit for semiconductor element |
JPS5692476A (en) * | 1979-12-26 | 1981-07-27 | Sony Corp | Measuring device of ic |
JPS60262072A (en) * | 1984-06-08 | 1985-12-25 | Internatl Rectifier Corp Japan Ltd | Characteristic measurement for semiconductor device |
-
1975
- 1975-05-12 JP JP5645375A patent/JPS51132086A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54127286A (en) * | 1978-03-27 | 1979-10-03 | Hitachi Ltd | Drift-waveform check unit for semiconductor element |
JPS5692476A (en) * | 1979-12-26 | 1981-07-27 | Sony Corp | Measuring device of ic |
JPS60262072A (en) * | 1984-06-08 | 1985-12-25 | Internatl Rectifier Corp Japan Ltd | Characteristic measurement for semiconductor device |
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