JPS51132086A - Specific characteristics variation testing device - Google Patents

Specific characteristics variation testing device

Info

Publication number
JPS51132086A
JPS51132086A JP5645375A JP5645375A JPS51132086A JP S51132086 A JPS51132086 A JP S51132086A JP 5645375 A JP5645375 A JP 5645375A JP 5645375 A JP5645375 A JP 5645375A JP S51132086 A JPS51132086 A JP S51132086A
Authority
JP
Japan
Prior art keywords
specific characteristics
testing device
characteristics variation
variation testing
variation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5645375A
Other languages
Japanese (ja)
Inventor
Takezo Nakanishi
Tsuguyoshi Hayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP5645375A priority Critical patent/JPS51132086A/en
Publication of JPS51132086A publication Critical patent/JPS51132086A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: To make it possible to detect the variation of specific characteristics of tested material automatically, not by eye sight.
COPYRIGHT: (C)1976,JPO&Japio
JP5645375A 1975-05-12 1975-05-12 Specific characteristics variation testing device Pending JPS51132086A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5645375A JPS51132086A (en) 1975-05-12 1975-05-12 Specific characteristics variation testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5645375A JPS51132086A (en) 1975-05-12 1975-05-12 Specific characteristics variation testing device

Publications (1)

Publication Number Publication Date
JPS51132086A true JPS51132086A (en) 1976-11-16

Family

ID=13027514

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5645375A Pending JPS51132086A (en) 1975-05-12 1975-05-12 Specific characteristics variation testing device

Country Status (1)

Country Link
JP (1) JPS51132086A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54127286A (en) * 1978-03-27 1979-10-03 Hitachi Ltd Drift-waveform check unit for semiconductor element
JPS5692476A (en) * 1979-12-26 1981-07-27 Sony Corp Measuring device of ic
JPS60262072A (en) * 1984-06-08 1985-12-25 Internatl Rectifier Corp Japan Ltd Characteristic measurement for semiconductor device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54127286A (en) * 1978-03-27 1979-10-03 Hitachi Ltd Drift-waveform check unit for semiconductor element
JPS5692476A (en) * 1979-12-26 1981-07-27 Sony Corp Measuring device of ic
JPS60262072A (en) * 1984-06-08 1985-12-25 Internatl Rectifier Corp Japan Ltd Characteristic measurement for semiconductor device

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