JPS5692476A - Measuring device of ic - Google Patents

Measuring device of ic

Info

Publication number
JPS5692476A
JPS5692476A JP17012979A JP17012979A JPS5692476A JP S5692476 A JPS5692476 A JP S5692476A JP 17012979 A JP17012979 A JP 17012979A JP 17012979 A JP17012979 A JP 17012979A JP S5692476 A JPS5692476 A JP S5692476A
Authority
JP
Japan
Prior art keywords
voltage
current
ram23
cpu21
measures
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17012979A
Other languages
Japanese (ja)
Inventor
Yukio Kakiuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP17012979A priority Critical patent/JPS5692476A/en
Publication of JPS5692476A publication Critical patent/JPS5692476A/en
Pending legal-status Critical Current

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Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: To accurately determine the breakage condition of ICs by using a microcomputer.
CONSTITUTION: A measuring circuit 11 which supplies voltage and current to the IC10 to be measured and measures the magnitudes of the voltage and current thereof, a CPU21, a memory 22 into which programs are written, an RAM23 which stores the measurement data of the circuit 11 and a display means 32 are provided. The CPU21 increases the voltage exponential-functionally and stepwise to the IC10, measures the voltage and current at each step, stores the measured data in the RAM23. Comparing these with the similar measured value after adding stress to the IC10, decides whether they are within a permissible difference or not to display the result of the decision on the display means 32.
COPYRIGHT: (C)1981,JPO&Japio
JP17012979A 1979-12-26 1979-12-26 Measuring device of ic Pending JPS5692476A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17012979A JPS5692476A (en) 1979-12-26 1979-12-26 Measuring device of ic

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17012979A JPS5692476A (en) 1979-12-26 1979-12-26 Measuring device of ic

Publications (1)

Publication Number Publication Date
JPS5692476A true JPS5692476A (en) 1981-07-27

Family

ID=15899181

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17012979A Pending JPS5692476A (en) 1979-12-26 1979-12-26 Measuring device of ic

Country Status (1)

Country Link
JP (1) JPS5692476A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5875073A (en) * 1981-10-29 1983-05-06 Yokogawa Hewlett Packard Ltd Dc characteristic measuring system
JPS59116063A (en) * 1982-12-23 1984-07-04 Nec Corp Testing method of breakdown in semiconductor device
JPS6267474A (en) * 1985-09-20 1987-03-27 Mitsubishi Electric Corp Semiconductor tester

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51132086A (en) * 1975-05-12 1976-11-16 Mitsubishi Electric Corp Specific characteristics variation testing device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51132086A (en) * 1975-05-12 1976-11-16 Mitsubishi Electric Corp Specific characteristics variation testing device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5875073A (en) * 1981-10-29 1983-05-06 Yokogawa Hewlett Packard Ltd Dc characteristic measuring system
JPH0472195B2 (en) * 1981-10-29 1992-11-17 Yokogawa Hyuuretsuto Patsukaado Kk
JPS59116063A (en) * 1982-12-23 1984-07-04 Nec Corp Testing method of breakdown in semiconductor device
JPS6267474A (en) * 1985-09-20 1987-03-27 Mitsubishi Electric Corp Semiconductor tester
JPH0521431B2 (en) * 1985-09-20 1993-03-24 Mitsubishi Electric Corp

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