JPS5754874A - Ic tester - Google Patents
Ic testerInfo
- Publication number
- JPS5754874A JPS5754874A JP55129344A JP12934480A JPS5754874A JP S5754874 A JPS5754874 A JP S5754874A JP 55129344 A JP55129344 A JP 55129344A JP 12934480 A JP12934480 A JP 12934480A JP S5754874 A JPS5754874 A JP S5754874A
- Authority
- JP
- Japan
- Prior art keywords
- model
- specimen
- decoder
- read
- test program
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
Abstract
PURPOSE:To read a model name from the surface of an IC package and select a test program of a specimen IC automatically from among pre-loaded programs. CONSTITUTION:A model mame recorded on the surface of a specimen IC10 is optically read by a reading device 2 and coaded by a decoder 3. A program matching the model read out by the decoder 3 of a memory device 4 is selected by a selecting device 5, and prescribed voltage and current are impressed on a prescribed terminal of the IC10 by a control unit 7. The data measured by a measuring device 8 are compared with reference data by a comparing device 9, and the results are indicated by an indicating device 11. When an IC is inserted into a measuring jig, a matching test program is automatically loaded, and therefore, length of time to prepare for inspection can be largely shortened.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55129344A JPS5754874A (en) | 1980-09-19 | 1980-09-19 | Ic tester |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55129344A JPS5754874A (en) | 1980-09-19 | 1980-09-19 | Ic tester |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5754874A true JPS5754874A (en) | 1982-04-01 |
Family
ID=15007282
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55129344A Pending JPS5754874A (en) | 1980-09-19 | 1980-09-19 | Ic tester |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5754874A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59176976U (en) * | 1983-05-13 | 1984-11-27 | 沖電気工業株式会社 | IC test equipment |
JPH09178807A (en) * | 1995-12-25 | 1997-07-11 | Nec Corp | Automatic handler for ic inspection |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5595881A (en) * | 1979-01-16 | 1980-07-21 | Toshiba Corp | Test device |
-
1980
- 1980-09-19 JP JP55129344A patent/JPS5754874A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5595881A (en) * | 1979-01-16 | 1980-07-21 | Toshiba Corp | Test device |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59176976U (en) * | 1983-05-13 | 1984-11-27 | 沖電気工業株式会社 | IC test equipment |
JPH09178807A (en) * | 1995-12-25 | 1997-07-11 | Nec Corp | Automatic handler for ic inspection |
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