JPS5754874A - Ic tester - Google Patents

Ic tester

Info

Publication number
JPS5754874A
JPS5754874A JP55129344A JP12934480A JPS5754874A JP S5754874 A JPS5754874 A JP S5754874A JP 55129344 A JP55129344 A JP 55129344A JP 12934480 A JP12934480 A JP 12934480A JP S5754874 A JPS5754874 A JP S5754874A
Authority
JP
Japan
Prior art keywords
model
specimen
decoder
read
test program
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55129344A
Other languages
Japanese (ja)
Inventor
Riichi Uetsuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP55129344A priority Critical patent/JPS5754874A/en
Publication of JPS5754874A publication Critical patent/JPS5754874A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE:To read a model name from the surface of an IC package and select a test program of a specimen IC automatically from among pre-loaded programs. CONSTITUTION:A model mame recorded on the surface of a specimen IC10 is optically read by a reading device 2 and coaded by a decoder 3. A program matching the model read out by the decoder 3 of a memory device 4 is selected by a selecting device 5, and prescribed voltage and current are impressed on a prescribed terminal of the IC10 by a control unit 7. The data measured by a measuring device 8 are compared with reference data by a comparing device 9, and the results are indicated by an indicating device 11. When an IC is inserted into a measuring jig, a matching test program is automatically loaded, and therefore, length of time to prepare for inspection can be largely shortened.
JP55129344A 1980-09-19 1980-09-19 Ic tester Pending JPS5754874A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55129344A JPS5754874A (en) 1980-09-19 1980-09-19 Ic tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55129344A JPS5754874A (en) 1980-09-19 1980-09-19 Ic tester

Publications (1)

Publication Number Publication Date
JPS5754874A true JPS5754874A (en) 1982-04-01

Family

ID=15007282

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55129344A Pending JPS5754874A (en) 1980-09-19 1980-09-19 Ic tester

Country Status (1)

Country Link
JP (1) JPS5754874A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59176976U (en) * 1983-05-13 1984-11-27 沖電気工業株式会社 IC test equipment
JPH09178807A (en) * 1995-12-25 1997-07-11 Nec Corp Automatic handler for ic inspection

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5595881A (en) * 1979-01-16 1980-07-21 Toshiba Corp Test device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5595881A (en) * 1979-01-16 1980-07-21 Toshiba Corp Test device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59176976U (en) * 1983-05-13 1984-11-27 沖電気工業株式会社 IC test equipment
JPH09178807A (en) * 1995-12-25 1997-07-11 Nec Corp Automatic handler for ic inspection

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