JPS59176976U

JPS59176976U - IC test equipment

Info

Publication number: JPS59176976U
Application number: JP7042483U
Authority: JP
Inventors: 平川　重樹; 明金山
Original assignee: 沖電気工業株式会社
Priority date: 1983-05-13
Filing date: 1983-05-13
Publication date: 1984-11-27

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

[Brief explanation of the drawing]

第１図はこの考案のＩＣ試験装置の一実施例の全体の構
成を示すブロック図、第２図は同上ＩＣ試験装置の品種
切替部の回路図、第３図は同上ＩＣ試験装置における品
種切替に関するコントローラのフローチャート、第４図
は同上ＩＣ試験装置における品種切替記憶素子のレイア
ウトを示す図、第５図は同上ＩＣ試験装置における品種
番号スイッチの入力回路図、第６図はこの考案のＩＣ試
験装置における品種切替部の他の実施例の回路図である
。１・・・操作表示部、１ａ・・・試験開始スイッチ、１
ｂ・・・品種番号スイッチ、ＩＣ・・・エラー表示部、
２・・・コントローラ、３・・・品種切替部、４・・・
計測部、８・・・品種切替記憶素子アドレス入力、９・
・・品種切替記憶素子出力、１０・・・記憶素子選択部
、１１・・・４ビツトラツチ、１２．１８・・・４−１
６デコーダ、１３・・・品種切替記憶素子部、１４．１
９・・・品種切替記憶部、１５．１７・・・品種番号ス
イッチ、１６・・・ＣＰＵデータバス。３０３第５図Fig. 1 is a block diagram showing the overall configuration of an embodiment of the IC testing device of this invention, Fig. 2 is a circuit diagram of the product type switching section of the above IC testing device, and Fig. 3 is a product type switching section in the same IC testing device. FIG. 4 is a diagram showing the layout of the type switching memory element in the IC testing device as described above, FIG. 5 is an input circuit diagram of the type number switch in the IC testing device as described above, and FIG. FIG. 7 is a circuit diagram of another embodiment of the product type switching unit in the device. 1...Operation display section, 1a...Test start switch, 1
b... Product number switch, IC... error display section,
2...Controller, 3...Type switching unit, 4...
Measuring unit, 8... Product type switching memory element address input, 9.
...Type switching memory element output, 10...Storage element selection section, 11...4 bit latch, 12.18...4-1
6 decoder, 13... type switching storage element section, 14.1
9... Product type switching storage section, 15.17... Product number switch, 16... CPU data bus. 303 Figure 5

Claims

[Scope of utility model registration request]

An operation display section that has a test start switch that generates a test start signal to a switch or key that can be set according to the type of IC, and a plurality of fixed memory elements that store test information corresponding to the type of IC mentioned above. a type switching section having;
In response to the test start signal, the product type switching section selects a predetermined I.
An fc test device comprising: a controller that selects the fixed storage element for C, retrieves the test information, and controls a measuring section to execute a test for C.