JPS5595881A - Test device - Google Patents

Test device

Info

Publication number
JPS5595881A
JPS5595881A JP352679A JP352679A JPS5595881A JP S5595881 A JPS5595881 A JP S5595881A JP 352679 A JP352679 A JP 352679A JP 352679 A JP352679 A JP 352679A JP S5595881 A JPS5595881 A JP S5595881A
Authority
JP
Japan
Prior art keywords
test
type
accordance
devices
program
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP352679A
Other languages
Japanese (ja)
Inventor
Akira Aida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP352679A priority Critical patent/JPS5595881A/en
Publication of JPS5595881A publication Critical patent/JPS5595881A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: To ensure performance of the test with no discontinuation even for the devices of different types by memorizing previously the programs corresponding to the types of devices and then designating the program in accordance with the type of the device.
CONSTITUTION: The mark of the semiconductor device is read at mark sense part 12 of handler 2, and the type of the device is decided through pattern recognizer 13. The programs of various types are memorized previously into the memory unit of test system 1. Thus the test is given to the semiconductor device sent into contact part 3 based on the test program which is designated in accordance with the type of the device.
COPYRIGHT: (C)1980,JPO&Japio
JP352679A 1979-01-16 1979-01-16 Test device Pending JPS5595881A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP352679A JPS5595881A (en) 1979-01-16 1979-01-16 Test device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP352679A JPS5595881A (en) 1979-01-16 1979-01-16 Test device

Publications (1)

Publication Number Publication Date
JPS5595881A true JPS5595881A (en) 1980-07-21

Family

ID=11559816

Family Applications (1)

Application Number Title Priority Date Filing Date
JP352679A Pending JPS5595881A (en) 1979-01-16 1979-01-16 Test device

Country Status (1)

Country Link
JP (1) JPS5595881A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5754874A (en) * 1980-09-19 1982-04-01 Hitachi Ltd Ic tester
JPS60148136A (en) * 1984-01-12 1985-08-05 Toshiba Corp Semiconductor testing device
JPH09178807A (en) * 1995-12-25 1997-07-11 Nec Corp Automatic handler for ic inspection

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5754874A (en) * 1980-09-19 1982-04-01 Hitachi Ltd Ic tester
JPS60148136A (en) * 1984-01-12 1985-08-05 Toshiba Corp Semiconductor testing device
JPH09178807A (en) * 1995-12-25 1997-07-11 Nec Corp Automatic handler for ic inspection

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