JPS5595881A - Test device - Google Patents
Test deviceInfo
- Publication number
- JPS5595881A JPS5595881A JP352679A JP352679A JPS5595881A JP S5595881 A JPS5595881 A JP S5595881A JP 352679 A JP352679 A JP 352679A JP 352679 A JP352679 A JP 352679A JP S5595881 A JPS5595881 A JP S5595881A
- Authority
- JP
- Japan
- Prior art keywords
- test
- type
- accordance
- devices
- program
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
PURPOSE: To ensure performance of the test with no discontinuation even for the devices of different types by memorizing previously the programs corresponding to the types of devices and then designating the program in accordance with the type of the device.
CONSTITUTION: The mark of the semiconductor device is read at mark sense part 12 of handler 2, and the type of the device is decided through pattern recognizer 13. The programs of various types are memorized previously into the memory unit of test system 1. Thus the test is given to the semiconductor device sent into contact part 3 based on the test program which is designated in accordance with the type of the device.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP352679A JPS5595881A (en) | 1979-01-16 | 1979-01-16 | Test device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP352679A JPS5595881A (en) | 1979-01-16 | 1979-01-16 | Test device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5595881A true JPS5595881A (en) | 1980-07-21 |
Family
ID=11559816
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP352679A Pending JPS5595881A (en) | 1979-01-16 | 1979-01-16 | Test device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5595881A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5754874A (en) * | 1980-09-19 | 1982-04-01 | Hitachi Ltd | Ic tester |
JPS60148136A (en) * | 1984-01-12 | 1985-08-05 | Toshiba Corp | Semiconductor testing device |
JPH09178807A (en) * | 1995-12-25 | 1997-07-11 | Nec Corp | Automatic handler for ic inspection |
-
1979
- 1979-01-16 JP JP352679A patent/JPS5595881A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5754874A (en) * | 1980-09-19 | 1982-04-01 | Hitachi Ltd | Ic tester |
JPS60148136A (en) * | 1984-01-12 | 1985-08-05 | Toshiba Corp | Semiconductor testing device |
JPH09178807A (en) * | 1995-12-25 | 1997-07-11 | Nec Corp | Automatic handler for ic inspection |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS51120180A (en) | Pattern printing device | |
JPS51141537A (en) | Memory access control device | |
JPS5595881A (en) | Test device | |
JPS51126733A (en) | Bubble memory characteristic measuring method. | |
JPS549846A (en) | Tester for automibile electronic controller | |
JPS5384651A (en) | Automatic test control system | |
JPS52155022A (en) | Magnetic disc memory control unit | |
JPS5423832A (en) | Detecting system of air-fuel ratio control device | |
JPS53113447A (en) | Information processor | |
JPS533128A (en) | Method and device for pattern analysis | |
JPS53107001A (en) | Automatic testing device for vehicle | |
JPS5360529A (en) | Data processor | |
JPS5228872A (en) | Method for measuring the size of thin plane | |
JPS5231417A (en) | Movable air conditioner | |
JPS5354428A (en) | Inspection method of semiconductor memory divice | |
JPS5319884A (en) | Mass marker | |
JPS52133738A (en) | Caluculation control system | |
JPS5222968A (en) | Testing device for insulation and some other performance test | |
JPS5369546A (en) | Method and apparatus for memory unit test | |
JPS5333553A (en) | Error correction device | |
JPS51111027A (en) | N+1 stand-by test method | |
JPS5357715A (en) | Testin device for memory device | |
JPS5539914A (en) | Address control system of microprogram control device | |
JPS52124814A (en) | Detection unit of minute pattern | |
JPS5382237A (en) | Test pattern of semiconductor circuit |