JPS5673361A - Testing device of ic - Google Patents

Testing device of ic

Info

Publication number
JPS5673361A
JPS5673361A JP15090179A JP15090179A JPS5673361A JP S5673361 A JPS5673361 A JP S5673361A JP 15090179 A JP15090179 A JP 15090179A JP 15090179 A JP15090179 A JP 15090179A JP S5673361 A JPS5673361 A JP S5673361A
Authority
JP
Japan
Prior art keywords
address
defect
memory
time
write
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15090179A
Other languages
Japanese (ja)
Other versions
JPS5938679B2 (en
Inventor
Kenji Kimura
Koji Ishikawa
Naoaki Narumi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Nippon Telegraph and Telephone Corp
Original Assignee
Advantest Corp
Nippon Telegraph and Telephone Corp
Takeda Riken Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp, Nippon Telegraph and Telephone Corp, Takeda Riken Industries Co Ltd filed Critical Advantest Corp
Priority to JP54150901A priority Critical patent/JPS5938679B2/en
Publication of JPS5673361A publication Critical patent/JPS5673361A/en
Publication of JPS5938679B2 publication Critical patent/JPS5938679B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE: To easily perform a defect analysis of the IC by a method wherein an expected value pattern when a defect, first, occurred in an element to be tested is stored in a memory and a defective address and a normal or abnormal pattern of an operation in the address are specified in a short time.
CONSTITUTION: When the defect of the element 3 to be tested is detected in a comparator 4, the address of that time is written in a defective address memory 5a1. At this time, before the write is performed, it must be identified whether or not the write has been already performed into the address to be written this time by means of a read circuit 7. And if any write is not performed as yet, the defective address is written in the address location, and at the same time, an expected value pattern is stored in the same address location of a memory 5a2. On this account, as for an address in which a defect once occurred, even if a defect is detected in the future, the content of the memory 5a2 is not rewritten.
COPYRIGHT: (C)1981,JPO&Japio
JP54150901A 1979-11-21 1979-11-21 IC test equipment Expired JPS5938679B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP54150901A JPS5938679B2 (en) 1979-11-21 1979-11-21 IC test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP54150901A JPS5938679B2 (en) 1979-11-21 1979-11-21 IC test equipment

Publications (2)

Publication Number Publication Date
JPS5673361A true JPS5673361A (en) 1981-06-18
JPS5938679B2 JPS5938679B2 (en) 1984-09-18

Family

ID=15506852

Family Applications (1)

Application Number Title Priority Date Filing Date
JP54150901A Expired JPS5938679B2 (en) 1979-11-21 1979-11-21 IC test equipment

Country Status (1)

Country Link
JP (1) JPS5938679B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998014954A1 (en) * 1996-09-30 1998-04-09 Advantest Corporation Memory tester

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02247478A (en) * 1989-03-17 1990-10-03 Mitsubishi Electric Corp Freezing refrigerator
JP4612150B2 (en) * 2000-05-24 2011-01-12 株式会社アドバンテスト Semiconductor device test equipment

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998014954A1 (en) * 1996-09-30 1998-04-09 Advantest Corporation Memory tester

Also Published As

Publication number Publication date
JPS5938679B2 (en) 1984-09-18

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