JPS5558896A - Analyzer for memory defect - Google Patents
Analyzer for memory defectInfo
- Publication number
- JPS5558896A JPS5558896A JP13073478A JP13073478A JPS5558896A JP S5558896 A JPS5558896 A JP S5558896A JP 13073478 A JP13073478 A JP 13073478A JP 13073478 A JP13073478 A JP 13073478A JP S5558896 A JPS5558896 A JP S5558896A
- Authority
- JP
- Japan
- Prior art keywords
- memory
- signal
- defective
- address signals
- recording
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE: To make easy and ensure the analysis for defective memory, by writing the result of test on the recording memory through blocked memory to be tested.
CONSTITUTION: The memory cell in matrix connection of tested memory 1 is split into four sets of blocks B1WB4. The output read out from the blocks B1WB4 selected sequentially with the address signal A0... and the set output are detected, and the defective bit detection circuit 17 produces the signal such as high level in case of failure. The multiplexers 11W14 fed with the address signals A0, A1... with this propriety signal produce the address signals A16WA12 formed with the upper 4-bit of the address signals A0, A1..., select the memory cell for RAM 16 for recording, and if defective signal is written in once, the defective signal is kept in the cell. When the recording of the result of test for the bolck B1 is finished, the address signals A16WA12 are advanced, and the result of test of the block B2 is recorded similarly. This is the same to the remaining blocks B3, B4 and the analysis of defect of memory can easily and surely be made.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13073478A JPS5558896A (en) | 1978-10-24 | 1978-10-24 | Analyzer for memory defect |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13073478A JPS5558896A (en) | 1978-10-24 | 1978-10-24 | Analyzer for memory defect |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5558896A true JPS5558896A (en) | 1980-05-01 |
Family
ID=15041344
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13073478A Pending JPS5558896A (en) | 1978-10-24 | 1978-10-24 | Analyzer for memory defect |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5558896A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5562598A (en) * | 1978-10-31 | 1980-05-12 | Nec Corp | Memory check unit |
JPS57130295A (en) * | 1981-02-03 | 1982-08-12 | Nec Corp | Inspecting device for ic memory |
JPS61283099A (en) * | 1985-06-07 | 1986-12-13 | Hitachi Electronics Eng Co Ltd | Memory inspecting data recording system |
JPH04177700A (en) * | 1990-11-13 | 1992-06-24 | Toshiba Corp | Memory fault analysis device |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5369546A (en) * | 1976-12-03 | 1978-06-21 | Fujitsu Ltd | Method and apparatus for memory unit test |
JPS54152929A (en) * | 1978-05-24 | 1979-12-01 | Fujitsu Ltd | Fail category bit map display system of lsi memory |
-
1978
- 1978-10-24 JP JP13073478A patent/JPS5558896A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5369546A (en) * | 1976-12-03 | 1978-06-21 | Fujitsu Ltd | Method and apparatus for memory unit test |
JPS54152929A (en) * | 1978-05-24 | 1979-12-01 | Fujitsu Ltd | Fail category bit map display system of lsi memory |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5562598A (en) * | 1978-10-31 | 1980-05-12 | Nec Corp | Memory check unit |
JPS57130295A (en) * | 1981-02-03 | 1982-08-12 | Nec Corp | Inspecting device for ic memory |
JPS6220640B2 (en) * | 1981-02-03 | 1987-05-08 | Nippon Electric Co | |
JPS61283099A (en) * | 1985-06-07 | 1986-12-13 | Hitachi Electronics Eng Co Ltd | Memory inspecting data recording system |
JPH04177700A (en) * | 1990-11-13 | 1992-06-24 | Toshiba Corp | Memory fault analysis device |
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