JPS5673363A - Testing device of ic - Google Patents

Testing device of ic

Info

Publication number
JPS5673363A
JPS5673363A JP15090379A JP15090379A JPS5673363A JP S5673363 A JPS5673363 A JP S5673363A JP 15090379 A JP15090379 A JP 15090379A JP 15090379 A JP15090379 A JP 15090379A JP S5673363 A JPS5673363 A JP S5673363A
Authority
JP
Japan
Prior art keywords
address
memory
stored
defective addresses
sequential
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15090379A
Other languages
Japanese (ja)
Other versions
JPS6011400B2 (en
Inventor
Kenji Kimura
Koji Ishikawa
Naoaki Narumi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Nippon Telegraph and Telephone Corp
Original Assignee
Advantest Corp
Nippon Telegraph and Telephone Corp
Takeda Riken Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp, Nippon Telegraph and Telephone Corp, Takeda Riken Industries Co Ltd filed Critical Advantest Corp
Priority to JP54150903A priority Critical patent/JPS6011400B2/en
Publication of JPS5673363A publication Critical patent/JPS5673363A/en
Publication of JPS6011400B2 publication Critical patent/JPS6011400B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)

Abstract

PURPOSE: To reduce a read time of defective addresses and to perform a defect analysis in a short time by a method wherein the defective addresses are sequentially stored in a sequential memory from the zero address.
CONSTITUTION: When a discord is detected in a comparator unit 4, the address signal is stored in an address fail memory 5a by means of the defect detection signal. Before this storage, the existence of the memory of the address location is identified through a read circuit 6. When a write does not exist, an H logical pulse is output from a gate 7b, and the address signal given to an element 3 to be tested at that time, an expected value pattern, defective data and a number of patterns are stored sequentially from a zero address in the sequential fail memory 5b. On this account, by means of reading the contents of the memory 5b after the test, defective addresses can be read out.
COPYRIGHT: (C)1981,JPO&Japio
JP54150903A 1979-11-21 1979-11-21 IC test equipment Expired JPS6011400B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP54150903A JPS6011400B2 (en) 1979-11-21 1979-11-21 IC test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP54150903A JPS6011400B2 (en) 1979-11-21 1979-11-21 IC test equipment

Publications (2)

Publication Number Publication Date
JPS5673363A true JPS5673363A (en) 1981-06-18
JPS6011400B2 JPS6011400B2 (en) 1985-03-25

Family

ID=15506897

Family Applications (1)

Application Number Title Priority Date Filing Date
JP54150903A Expired JPS6011400B2 (en) 1979-11-21 1979-11-21 IC test equipment

Country Status (1)

Country Link
JP (1) JPS6011400B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60106100A (en) * 1983-11-15 1985-06-11 Fujitsu Ltd Testing system of semiconductor memory
WO1998014954A1 (en) * 1996-09-30 1998-04-09 Advantest Corporation Memory tester

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60106100A (en) * 1983-11-15 1985-06-11 Fujitsu Ltd Testing system of semiconductor memory
WO1998014954A1 (en) * 1996-09-30 1998-04-09 Advantest Corporation Memory tester

Also Published As

Publication number Publication date
JPS6011400B2 (en) 1985-03-25

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