JPS5721000A - Memory measuring device - Google Patents

Memory measuring device

Info

Publication number
JPS5721000A
JPS5721000A JP9604980A JP9604980A JPS5721000A JP S5721000 A JPS5721000 A JP S5721000A JP 9604980 A JP9604980 A JP 9604980A JP 9604980 A JP9604980 A JP 9604980A JP S5721000 A JPS5721000 A JP S5721000A
Authority
JP
Japan
Prior art keywords
memory
fbm101
pattern generator
outputted
counter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9604980A
Other languages
Japanese (ja)
Inventor
Hiroshi Watabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP9604980A priority Critical patent/JPS5721000A/en
Publication of JPS5721000A publication Critical patent/JPS5721000A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)

Abstract

PURPOSE:To discriminate at a high speed whether a memory to be measured is normal or not, by counting the number of defective bits accurately. CONSTITUTION:Address information 103 and input data information 104 outputted from a pattern generator 102 are supplied to an FBM101 and a memory 106 to be measured to compare the output 107 of the memory 106 with expected data 105 outputted from the pattern generator and when the both do not coincide with each other, a fail signal 109 is generated to write a 1 in an error address of the FBM101. After the completion of a test, a counter 301 is set to a 0 and addresses are generated and supplied by the pattern generator to the FBM101 successively; after the FBM is read within a prescribed range, the contents of the counter 301 and read to know the number of defective bits.
JP9604980A 1980-07-14 1980-07-14 Memory measuring device Pending JPS5721000A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9604980A JPS5721000A (en) 1980-07-14 1980-07-14 Memory measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9604980A JPS5721000A (en) 1980-07-14 1980-07-14 Memory measuring device

Publications (1)

Publication Number Publication Date
JPS5721000A true JPS5721000A (en) 1982-02-03

Family

ID=14154602

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9604980A Pending JPS5721000A (en) 1980-07-14 1980-07-14 Memory measuring device

Country Status (1)

Country Link
JP (1) JPS5721000A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63127499A (en) * 1986-11-17 1988-05-31 Yamada Denon Kk Device for inspecting memory element
JPS6414797A (en) * 1987-07-08 1989-01-18 Nec Corp Semiconductor integrated memory
EP0347970A2 (en) * 1988-06-18 1989-12-27 Philips Patentverwaltung GmbH Read-only memory test method, and device for carrying out the method
JPH0296700U (en) * 1989-01-12 1990-08-01

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63127499A (en) * 1986-11-17 1988-05-31 Yamada Denon Kk Device for inspecting memory element
JPS6414797A (en) * 1987-07-08 1989-01-18 Nec Corp Semiconductor integrated memory
EP0347970A2 (en) * 1988-06-18 1989-12-27 Philips Patentverwaltung GmbH Read-only memory test method, and device for carrying out the method
JPH0296700U (en) * 1989-01-12 1990-08-01

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