JPH0296700U - - Google Patents

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Publication number
JPH0296700U
JPH0296700U JP258689U JP258689U JPH0296700U JP H0296700 U JPH0296700 U JP H0296700U JP 258689 U JP258689 U JP 258689U JP 258689 U JP258689 U JP 258689U JP H0296700 U JPH0296700 U JP H0296700U
Authority
JP
Japan
Prior art keywords
memory
fail
signal
counter
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP258689U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP258689U priority Critical patent/JPH0296700U/ja
Publication of JPH0296700U publication Critical patent/JPH0296700U/ja
Pending legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図はこの考案による実施例の構成図、第２
図は第１図のメモリの説明図、第３図は従来技術
による構成図である。 １……ＤＵＴ、２……フエイルメモリ、３……
Ｘメモリ、４……Ｙメモリ、５……Ｘカウンタ、
６……Ｙカウンタ。 Figure 1 is a configuration diagram of an embodiment according to this invention, Figure 2
The figure is an explanatory diagram of the memory shown in FIG. 1, and FIG. 3 is a configuration diagram according to the prior art. 1...DUT, 2...Fail memory, 3...
X memory, 4...Y memory, 5...X counter,
6...Y counter.

Claims (1)

【実用新案登録請求の範囲】 ＤＵＴ１のフエイルを書き込むフエイルメモリ
２と、フエイルメモリ２の信号１１とＸアドレス
信号１２を入力とするＸメモリ３と、フエイルメ
モリ２の信号１１とＹアドレス信号１３を入力と
するＹメモリ４とをもつメモリＩＣの不良表示回
路であつて、 Ｘメモリ３に接続されるＸカウンタ５と、 Ｙメモリ４に接続されるＹカウンタ６とを備え
ることを特徴とするメモリＩＣの不良個所計数回
路。[Claims for Utility Model Registration] A fail memory 2 in which the fail of the DUT 1 is written, an X memory 3 to which the signal 11 of the fail memory 2 and the X address signal 12 are input, and a signal 11 of the fail memory 2 and the Y address signal 13 are input. A defective display circuit for a memory IC having a Y memory 4, characterized in that it comprises an X counter 5 connected to the X memory 3, and a Y counter 6 connected to the Y memory 4. Place counting circuit.
JP258689U 1989-01-12 1989-01-12 Pending JPH0296700U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP258689U JPH0296700U (en) 1989-01-12 1989-01-12

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP258689U JPH0296700U (en) 1989-01-12 1989-01-12

Publications (1)

Publication Number Publication Date
JPH0296700U true JPH0296700U (en) 1990-08-01

Family

ID=31203481

Family Applications (1)

Application Number Title Priority Date Filing Date
JP258689U Pending JPH0296700U (en) 1989-01-12 1989-01-12

Country Status (1)

Country Link
JP (1) JPH0296700U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008020238A (en) * 2006-07-11 2008-01-31 Yokogawa Electric Corp Signal process device and tester for semiconductor integrated circuit

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5721000A (en) * 1980-07-14 1982-02-03 Nec Corp Memory measuring device
JPS62204500A (en) * 1986-03-04 1987-09-09 Mitsubishi Electric Corp Testing instrument for memory ic with multioutput redundancy circuit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5721000A (en) * 1980-07-14 1982-02-03 Nec Corp Memory measuring device
JPS62204500A (en) * 1986-03-04 1987-09-09 Mitsubishi Electric Corp Testing instrument for memory ic with multioutput redundancy circuit

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008020238A (en) * 2006-07-11 2008-01-31 Yokogawa Electric Corp Signal process device and tester for semiconductor integrated circuit
JP4706577B2 (en) * 2006-07-11 2011-06-22 横河電機株式会社 Signal processing apparatus and semiconductor integrated circuit test apparatus

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