JPS5673354A - Testing device for ic - Google Patents
Testing device for icInfo
- Publication number
- JPS5673354A JPS5673354A JP15089479A JP15089479A JPS5673354A JP S5673354 A JPS5673354 A JP S5673354A JP 15089479 A JP15089479 A JP 15089479A JP 15089479 A JP15089479 A JP 15089479A JP S5673354 A JPS5673354 A JP S5673354A
- Authority
- JP
- Japan
- Prior art keywords
- blocks
- test
- separated
- expected value
- defect
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Techniques For Improving Reliability Of Storages (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Abstract
PURPOSE: To enable to store various kinds of data by each different timing and to reduce a test time by a method wherein a sequence memory is separated into a plural number of blocks and a write operation is controlled according to each block.
CONSTITUTION: A sequential fail memory in a defect analytic device 5 is separated into blocks 5b1W5b4 and each block of 5b1W5b4 is controlled by write pulse generators 7aW7d and an address counter which actuate in accordance with each kind of condition described in each of different setting devices 6aW6d, respectively. During a test, a test pattern signal from a generator 1 is supplied to an element to be tested 3 through a programmable data selector 2 and the output signal of the element 3 is compared with an expected value pattern come from the selector 2 in a comparator unit 4 and when a defect is detected, defective data, expected value patterns and pattern counter values are analyzed on the basis of a storage contents of an address fail memory 5a and blocks 5b1W5b4.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15089479A JPS5673354A (en) | 1979-11-21 | 1979-11-21 | Testing device for ic |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15089479A JPS5673354A (en) | 1979-11-21 | 1979-11-21 | Testing device for ic |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5673354A true JPS5673354A (en) | 1981-06-18 |
Family
ID=15506696
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15089479A Pending JPS5673354A (en) | 1979-11-21 | 1979-11-21 | Testing device for ic |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5673354A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS585681A (en) * | 1981-06-30 | 1983-01-13 | Mitsubishi Electric Corp | Testing device for semiconductor memory |
US5317573A (en) * | 1989-08-30 | 1994-05-31 | International Business Machines Corporation | Apparatus and method for real time data error capture and compression redundancy analysis |
WO1998027556A1 (en) * | 1996-12-19 | 1998-06-25 | Advantest Corporation | Memory test set |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3116819A (en) * | 1962-07-16 | 1964-01-07 | Gen Electric | Filament loading mechanism |
JPS4931075B1 (en) * | 1969-11-29 | 1974-08-19 | ||
US3966040A (en) * | 1975-03-05 | 1976-06-29 | Hazelwood John E | Combined vibratory feeder drive unit, vibratory feeder bowl, and parts separator |
-
1979
- 1979-11-21 JP JP15089479A patent/JPS5673354A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3116819A (en) * | 1962-07-16 | 1964-01-07 | Gen Electric | Filament loading mechanism |
JPS4931075B1 (en) * | 1969-11-29 | 1974-08-19 | ||
US3966040A (en) * | 1975-03-05 | 1976-06-29 | Hazelwood John E | Combined vibratory feeder drive unit, vibratory feeder bowl, and parts separator |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS585681A (en) * | 1981-06-30 | 1983-01-13 | Mitsubishi Electric Corp | Testing device for semiconductor memory |
JPH0326480B2 (en) * | 1981-06-30 | 1991-04-10 | Mitsubishi Electric Corp | |
US5317573A (en) * | 1989-08-30 | 1994-05-31 | International Business Machines Corporation | Apparatus and method for real time data error capture and compression redundancy analysis |
WO1998027556A1 (en) * | 1996-12-19 | 1998-06-25 | Advantest Corporation | Memory test set |
US6061813A (en) * | 1996-12-19 | 2000-05-09 | Advantest Corporation | Memory test set |
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