JPS5693060A - Selecting device for linear type ic circuit - Google Patents

Selecting device for linear type ic circuit

Info

Publication number
JPS5693060A
JPS5693060A JP17167879A JP17167879A JPS5693060A JP S5693060 A JPS5693060 A JP S5693060A JP 17167879 A JP17167879 A JP 17167879A JP 17167879 A JP17167879 A JP 17167879A JP S5693060 A JPS5693060 A JP S5693060A
Authority
JP
Japan
Prior art keywords
circuit
wave form
selector
under test
pulse signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17167879A
Other languages
Japanese (ja)
Inventor
Yoshitake Nagashima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP17167879A priority Critical patent/JPS5693060A/en
Publication of JPS5693060A publication Critical patent/JPS5693060A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: To enable speedy selection as well as shortening much of the measuring time by storing in a wave form memory the output wave form of the IC circuit under test which is a reaction to a single pulse signal and comparing it with the reference output and judging it by a selector.
CONSTITUTION: Signal generator 1 applies a pulse signal such as a single impulse or a step pulse to the IC circuit 2 under test. The output response wave form of the IC circuit 2 corresponding to this pulse signal is stored in the wave form memory 3 and is converted into an S-plane by high speed Fourier converter FFT4, then conveyed to the selector 5. Expected figures for an acceptable IC circuit are stored in the selector 5 as a reference valve and by comparing it with the figures converted from the response wave form of IC circuit 2, judgement is made on whether the IC circuit 2 under test is acceptable or not. Thus, measuring time can be well shortened and high speed selection becomes possible.
COPYRIGHT: (C)1981,JPO&Japio
JP17167879A 1979-12-27 1979-12-27 Selecting device for linear type ic circuit Pending JPS5693060A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17167879A JPS5693060A (en) 1979-12-27 1979-12-27 Selecting device for linear type ic circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17167879A JPS5693060A (en) 1979-12-27 1979-12-27 Selecting device for linear type ic circuit

Publications (1)

Publication Number Publication Date
JPS5693060A true JPS5693060A (en) 1981-07-28

Family

ID=15927662

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17167879A Pending JPS5693060A (en) 1979-12-27 1979-12-27 Selecting device for linear type ic circuit

Country Status (1)

Country Link
JP (1) JPS5693060A (en)

Similar Documents

Publication Publication Date Title
JPS5585265A (en) Function test evaluation device for integrated circuit
JPS5585264A (en) Function test evaluation device for integrated circuit
JPS5693060A (en) Selecting device for linear type ic circuit
JPS5565162A (en) Wafer prober
JPS5293361A (en) Automatic tester
JPS5587963A (en) System for testing semiconductor integrated circuit element
JPS5479569A (en) Intergrated circuit
JPS5410810A (en) Tester for electronic controller of automobile
JPS5549757A (en) Test method of testing shift path
JPS5690271A (en) Testing method for logic device
JPS5684570A (en) Testing device for ic
JPS5657169A (en) Programmable sequencer
JPS5682466A (en) Integrated logic chip device
JPH0639350Y2 (en) IC test equipment
JPS52134406A (en) Test system for clock generator circuit
JPS55117798A (en) Testing device for memory unit
JPS5379329A (en) Test method of memory circuit
JPS5410811A (en) Tester for electronic controller of automobile
JPS53121542A (en) Test method
JPS6454380A (en) Electronic circuit package with automatic testing function
JPS54102987A (en) Test device
JPS5715296A (en) Testing system for storage device
JPS5367086A (en) Logic sequence system
JPS53119642A (en) Testing equipment for logic circuit
JPS5384651A (en) Automatic test control system