JPS5324883A - Vicker's hardness tester - Google Patents

Vicker's hardness tester

Info

Publication number
JPS5324883A
JPS5324883A JP9905076A JP9905076A JPS5324883A JP S5324883 A JPS5324883 A JP S5324883A JP 9905076 A JP9905076 A JP 9905076A JP 9905076 A JP9905076 A JP 9905076A JP S5324883 A JPS5324883 A JP S5324883A
Authority
JP
Japan
Prior art keywords
vicker
hardness tester
indentation
accomplish
image sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9905076A
Other languages
Japanese (ja)
Other versions
JPS605894B2 (en
Inventor
Junpei Tsujiuchi
Toshio Honda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to JP51099050A priority Critical patent/JPS605894B2/en
Priority to GB34186/77A priority patent/GB1563570A/en
Priority to US05/825,398 priority patent/US4147052A/en
Priority to CH1015677A priority patent/CH617772A5/fr
Priority to DE19772737554 priority patent/DE2737554A1/en
Publication of JPS5324883A publication Critical patent/JPS5324883A/en
Publication of JPS605894B2 publication Critical patent/JPS605894B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Abstract

PURPOSE: To accomplish the Vicker's hardness test stably in a high precision by photoelectrically measuring the diagonal length of a indentation with the use of an image sensor.
COPYRIGHT: (C)1978,JPO&Japio
JP51099050A 1976-08-19 1976-08-19 Bitkers hardness tester Expired JPS605894B2 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP51099050A JPS605894B2 (en) 1976-08-19 1976-08-19 Bitkers hardness tester
GB34186/77A GB1563570A (en) 1976-08-19 1977-08-15 Hardness tester
US05/825,398 US4147052A (en) 1976-08-19 1977-08-17 Hardness tester
CH1015677A CH617772A5 (en) 1976-08-19 1977-08-18
DE19772737554 DE2737554A1 (en) 1976-08-19 1977-08-19 DEVICE FOR HARDNESS TESTING

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP51099050A JPS605894B2 (en) 1976-08-19 1976-08-19 Bitkers hardness tester

Publications (2)

Publication Number Publication Date
JPS5324883A true JPS5324883A (en) 1978-03-08
JPS605894B2 JPS605894B2 (en) 1985-02-14

Family

ID=14236733

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51099050A Expired JPS605894B2 (en) 1976-08-19 1976-08-19 Bitkers hardness tester

Country Status (1)

Country Link
JP (1) JPS605894B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0126776A1 (en) * 1982-09-25 1984-12-05 Matsuzawa Seiki Kabushikikaisha Indentation hardness tester
US4691559A (en) * 1985-02-07 1987-09-08 Helmut Fischer Device for measuring the properties of solid materials which can be derived from the behavior of a penetrating body
JPS636437A (en) * 1986-06-19 1988-01-12 Akashi Seisakusho Co Ltd Pyramidal indenter for electron microscope
CN104075954A (en) * 2013-03-28 2014-10-01 株式会社三丰 Hardness tester and hardness test method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5444473A (en) * 1977-09-16 1979-04-07 Toshiba Corp Nanufacture for semiconductor device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5444473A (en) * 1977-09-16 1979-04-07 Toshiba Corp Nanufacture for semiconductor device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0126776A1 (en) * 1982-09-25 1984-12-05 Matsuzawa Seiki Kabushikikaisha Indentation hardness tester
US4691559A (en) * 1985-02-07 1987-09-08 Helmut Fischer Device for measuring the properties of solid materials which can be derived from the behavior of a penetrating body
JPS636437A (en) * 1986-06-19 1988-01-12 Akashi Seisakusho Co Ltd Pyramidal indenter for electron microscope
CN104075954A (en) * 2013-03-28 2014-10-01 株式会社三丰 Hardness tester and hardness test method

Also Published As

Publication number Publication date
JPS605894B2 (en) 1985-02-14

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