JPS533262A - Radiation thickness meter - Google Patents

Radiation thickness meter

Info

Publication number
JPS533262A
JPS533262A JP7601576A JP7601576A JPS533262A JP S533262 A JPS533262 A JP S533262A JP 7601576 A JP7601576 A JP 7601576A JP 7601576 A JP7601576 A JP 7601576A JP S533262 A JPS533262 A JP S533262A
Authority
JP
Japan
Prior art keywords
thickness meter
radiation thickness
radiation
values
measurement accuracy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7601576A
Other languages
Japanese (ja)
Inventor
Tatsuo Tsujii
Kazunori Masanobu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP7601576A priority Critical patent/JPS533262A/en
Publication of JPS533262A publication Critical patent/JPS533262A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To raise measurement accuracy by testing comparatively the standard values of a radiation thickness meter to its theoretical values.
COPYRIGHT: (C)1978,JPO&Japio
JP7601576A 1976-06-29 1976-06-29 Radiation thickness meter Pending JPS533262A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7601576A JPS533262A (en) 1976-06-29 1976-06-29 Radiation thickness meter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7601576A JPS533262A (en) 1976-06-29 1976-06-29 Radiation thickness meter

Publications (1)

Publication Number Publication Date
JPS533262A true JPS533262A (en) 1978-01-12

Family

ID=13592985

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7601576A Pending JPS533262A (en) 1976-06-29 1976-06-29 Radiation thickness meter

Country Status (1)

Country Link
JP (1) JPS533262A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5862508A (en) * 1981-09-18 1983-04-14 Data Measurement Corp Device and method of measuring thickness
US9863897B2 (en) 2013-03-04 2018-01-09 Tokyo Electron Limited X-ray nondestructive testing device
US11506487B2 (en) 2020-03-06 2022-11-22 Delta Electronics, Inc. X-ray imaging method and system thereof

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5862508A (en) * 1981-09-18 1983-04-14 Data Measurement Corp Device and method of measuring thickness
US4574387A (en) * 1981-09-18 1986-03-04 Data Measurement Corporation Apparatus and method for measuring thickness
US9863897B2 (en) 2013-03-04 2018-01-09 Tokyo Electron Limited X-ray nondestructive testing device
US11506487B2 (en) 2020-03-06 2022-11-22 Delta Electronics, Inc. X-ray imaging method and system thereof

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