JPS5720674A - Lsi tester - Google Patents
Lsi testerInfo
- Publication number
- JPS5720674A JPS5720674A JP9471980A JP9471980A JPS5720674A JP S5720674 A JPS5720674 A JP S5720674A JP 9471980 A JP9471980 A JP 9471980A JP 9471980 A JP9471980 A JP 9471980A JP S5720674 A JPS5720674 A JP S5720674A
- Authority
- JP
- Japan
- Prior art keywords
- test
- patterns
- tested
- registers
- control part
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/316—Testing of analog circuits
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE:To reduce test time and improve the efficiency of tests requiring random test patterns by operating plural test heads simultaneously or by changing over these by every one test unit. CONSTITUTION:The test patterns transferred from a control part to a delivery part 12 are formed to prescribed waveforms by a format forming circuit 41, after which they are applied via multiplexers 44, 45, and the drivers for test heads to the input pins of the device LSI to be tested. The outputs of the device LSI are applied to decision parts 49, 50 constituting a comparing part 17, where they are compared with comparison patterns which are transmitted from a holding register 48 and are references. The device outputs differing from the comparison patterns are stored as fail information into fail registers 51, 52. Upon completion of the test, the information of the registers 51, 52 is fed to the control part. Thereby, plural pieces of the devices are tested and processed at high speeds.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9471980A JPS5720674A (en) | 1980-07-11 | 1980-07-11 | Lsi tester |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9471980A JPS5720674A (en) | 1980-07-11 | 1980-07-11 | Lsi tester |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5720674A true JPS5720674A (en) | 1982-02-03 |
Family
ID=14117932
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9471980A Pending JPS5720674A (en) | 1980-07-11 | 1980-07-11 | Lsi tester |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5720674A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59225368A (en) * | 1983-06-06 | 1984-12-18 | Fujitsu Ltd | Logic circuit tester |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53141582A (en) * | 1977-05-16 | 1978-12-09 | Toshiba Corp | Character test system of semiconductor device |
JPS5585265A (en) * | 1978-12-23 | 1980-06-27 | Toshiba Corp | Function test evaluation device for integrated circuit |
-
1980
- 1980-07-11 JP JP9471980A patent/JPS5720674A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53141582A (en) * | 1977-05-16 | 1978-12-09 | Toshiba Corp | Character test system of semiconductor device |
JPS5585265A (en) * | 1978-12-23 | 1980-06-27 | Toshiba Corp | Function test evaluation device for integrated circuit |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59225368A (en) * | 1983-06-06 | 1984-12-18 | Fujitsu Ltd | Logic circuit tester |
JPH0562311B2 (en) * | 1983-06-06 | 1993-09-08 | Fujitsu Ltd |
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