JPS5720674A - Lsi tester - Google Patents

Lsi tester

Info

Publication number
JPS5720674A
JPS5720674A JP9471980A JP9471980A JPS5720674A JP S5720674 A JPS5720674 A JP S5720674A JP 9471980 A JP9471980 A JP 9471980A JP 9471980 A JP9471980 A JP 9471980A JP S5720674 A JPS5720674 A JP S5720674A
Authority
JP
Japan
Prior art keywords
test
patterns
tested
registers
control part
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9471980A
Other languages
Japanese (ja)
Inventor
Kiyosato Izawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP9471980A priority Critical patent/JPS5720674A/en
Publication of JPS5720674A publication Critical patent/JPS5720674A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE:To reduce test time and improve the efficiency of tests requiring random test patterns by operating plural test heads simultaneously or by changing over these by every one test unit. CONSTITUTION:The test patterns transferred from a control part to a delivery part 12 are formed to prescribed waveforms by a format forming circuit 41, after which they are applied via multiplexers 44, 45, and the drivers for test heads to the input pins of the device LSI to be tested. The outputs of the device LSI are applied to decision parts 49, 50 constituting a comparing part 17, where they are compared with comparison patterns which are transmitted from a holding register 48 and are references. The device outputs differing from the comparison patterns are stored as fail information into fail registers 51, 52. Upon completion of the test, the information of the registers 51, 52 is fed to the control part. Thereby, plural pieces of the devices are tested and processed at high speeds.
JP9471980A 1980-07-11 1980-07-11 Lsi tester Pending JPS5720674A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9471980A JPS5720674A (en) 1980-07-11 1980-07-11 Lsi tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9471980A JPS5720674A (en) 1980-07-11 1980-07-11 Lsi tester

Publications (1)

Publication Number Publication Date
JPS5720674A true JPS5720674A (en) 1982-02-03

Family

ID=14117932

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9471980A Pending JPS5720674A (en) 1980-07-11 1980-07-11 Lsi tester

Country Status (1)

Country Link
JP (1) JPS5720674A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59225368A (en) * 1983-06-06 1984-12-18 Fujitsu Ltd Logic circuit tester

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53141582A (en) * 1977-05-16 1978-12-09 Toshiba Corp Character test system of semiconductor device
JPS5585265A (en) * 1978-12-23 1980-06-27 Toshiba Corp Function test evaluation device for integrated circuit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53141582A (en) * 1977-05-16 1978-12-09 Toshiba Corp Character test system of semiconductor device
JPS5585265A (en) * 1978-12-23 1980-06-27 Toshiba Corp Function test evaluation device for integrated circuit

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59225368A (en) * 1983-06-06 1984-12-18 Fujitsu Ltd Logic circuit tester
JPH0562311B2 (en) * 1983-06-06 1993-09-08 Fujitsu Ltd

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