JPS5365030A - Functional test method for logic circuits - Google Patents
Functional test method for logic circuitsInfo
- Publication number
- JPS5365030A JPS5365030A JP14084176A JP14084176A JPS5365030A JP S5365030 A JPS5365030 A JP S5365030A JP 14084176 A JP14084176 A JP 14084176A JP 14084176 A JP14084176 A JP 14084176A JP S5365030 A JPS5365030 A JP S5365030A
- Authority
- JP
- Japan
- Prior art keywords
- functional test
- test method
- logic circuits
- time
- plrual
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE: To realize the method simultaneously performing the functional test for a plrual number of semiconductors with one set of tester within the same time, by applying the input signal by a common timing and judging the quality to a plruality of measured objects in time-sharingly.
COPYRIGHT: (C)1978,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14084176A JPS5365030A (en) | 1976-11-22 | 1976-11-22 | Functional test method for logic circuits |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14084176A JPS5365030A (en) | 1976-11-22 | 1976-11-22 | Functional test method for logic circuits |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5365030A true JPS5365030A (en) | 1978-06-10 |
Family
ID=15277951
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14084176A Pending JPS5365030A (en) | 1976-11-22 | 1976-11-22 | Functional test method for logic circuits |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5365030A (en) |
-
1976
- 1976-11-22 JP JP14084176A patent/JPS5365030A/en active Pending
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