JPS5219032A - Ic memory function testing method - Google Patents
Ic memory function testing methodInfo
- Publication number
- JPS5219032A JPS5219032A JP50094254A JP9425475A JPS5219032A JP S5219032 A JPS5219032 A JP S5219032A JP 50094254 A JP50094254 A JP 50094254A JP 9425475 A JP9425475 A JP 9425475A JP S5219032 A JPS5219032 A JP S5219032A
- Authority
- JP
- Japan
- Prior art keywords
- testing method
- memory function
- function testing
- test
- gallopping
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Static Random-Access Memory (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Abstract
PURPOSE: Reduce required test time and give the same test-condition strictness as that for gallopping test patterns.
COPYRIGHT: (C)1977,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP50094254A JPS5219032A (en) | 1975-08-04 | 1975-08-04 | Ic memory function testing method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP50094254A JPS5219032A (en) | 1975-08-04 | 1975-08-04 | Ic memory function testing method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5219032A true JPS5219032A (en) | 1977-01-14 |
Family
ID=14105146
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP50094254A Pending JPS5219032A (en) | 1975-08-04 | 1975-08-04 | Ic memory function testing method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5219032A (en) |
-
1975
- 1975-08-04 JP JP50094254A patent/JPS5219032A/en active Pending
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5219032A (en) | Ic memory function testing method | |
JPS51118932A (en) | Write-modify method of program and the device | |
JPS51121229A (en) | A console for a micro-computer | |
JPS5247343A (en) | Test equipment for program control apparatus | |
JPS549846A (en) | Tester for automibile electronic controller | |
JPS538569A (en) | Ic test method | |
JPS5216177A (en) | Probe card | |
JPS51113665A (en) | Method and apparatus of the selection of goods for testing | |
JPS5338266A (en) | Screening method of semiconductors and device for the same | |
JPS5231625A (en) | Memory test method | |
JPS5369546A (en) | Method and apparatus for memory unit test | |
JPS51138357A (en) | Automatic checking apparatus for logic circuits | |
JPS5384651A (en) | Automatic test control system | |
JPS53119642A (en) | Testing equipment for logic circuit | |
JPS5357715A (en) | Testin device for memory device | |
JPS5219079A (en) | Ic tester | |
JPS545632A (en) | Test method for memory unit | |
JPS5333540A (en) | Memory test unit | |
JPS51147936A (en) | Logic circuit testing apparatus | |
JPS51128577A (en) | Pulse width compare circuit | |
JPS51138343A (en) | Memory device | |
JPS5383430A (en) | Test method for terminal unit | |
JPS51140756A (en) | Equipment for inspecting shape of articles | |
JPS5233228A (en) | Automatic running control apparatus for vehicle | |
JPS51146127A (en) | Memory device |