JPS5219079A - Ic tester - Google Patents
Ic testerInfo
- Publication number
- JPS5219079A JPS5219079A JP50095522A JP9552275A JPS5219079A JP S5219079 A JPS5219079 A JP S5219079A JP 50095522 A JP50095522 A JP 50095522A JP 9552275 A JP9552275 A JP 9552275A JP S5219079 A JPS5219079 A JP S5219079A
- Authority
- JP
- Japan
- Prior art keywords
- tester
- promote
- order
- operating ratio
- probe machine
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
PURPOSE: In order to promote the operating ratio of two multi-probe machine.
COPYRIGHT: (C)1977,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP50095522A JPS5219079A (en) | 1975-08-06 | 1975-08-06 | Ic tester |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP50095522A JPS5219079A (en) | 1975-08-06 | 1975-08-06 | Ic tester |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5219079A true JPS5219079A (en) | 1977-01-14 |
Family
ID=14139885
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP50095522A Pending JPS5219079A (en) | 1975-08-06 | 1975-08-06 | Ic tester |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5219079A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63129640A (en) * | 1986-11-20 | 1988-06-02 | Tokyo Electron Ltd | Probing apparatus |
JPH0216076U (en) * | 1988-07-19 | 1990-02-01 |
-
1975
- 1975-08-06 JP JP50095522A patent/JPS5219079A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63129640A (en) * | 1986-11-20 | 1988-06-02 | Tokyo Electron Ltd | Probing apparatus |
JPH0216076U (en) * | 1988-07-19 | 1990-02-01 |
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