JPS5338266A - Screening method of semiconductors and device for the same - Google Patents

Screening method of semiconductors and device for the same

Info

Publication number
JPS5338266A
JPS5338266A JP11186976A JP11186976A JPS5338266A JP S5338266 A JPS5338266 A JP S5338266A JP 11186976 A JP11186976 A JP 11186976A JP 11186976 A JP11186976 A JP 11186976A JP S5338266 A JPS5338266 A JP S5338266A
Authority
JP
Japan
Prior art keywords
semiconductors
same
screening method
chips
quickdry
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11186976A
Other languages
Japanese (ja)
Inventor
Nobuo Sato
Yoshiharu Mori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP11186976A priority Critical patent/JPS5338266A/en
Publication of JPS5338266A publication Critical patent/JPS5338266A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE: To automate screening of defective chips by beforehand coating quickdry type magnetic inks to rejected chips.
COPYRIGHT: (C)1978,JPO&Japio
JP11186976A 1976-09-20 1976-09-20 Screening method of semiconductors and device for the same Pending JPS5338266A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11186976A JPS5338266A (en) 1976-09-20 1976-09-20 Screening method of semiconductors and device for the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11186976A JPS5338266A (en) 1976-09-20 1976-09-20 Screening method of semiconductors and device for the same

Publications (1)

Publication Number Publication Date
JPS5338266A true JPS5338266A (en) 1978-04-08

Family

ID=14572192

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11186976A Pending JPS5338266A (en) 1976-09-20 1976-09-20 Screening method of semiconductors and device for the same

Country Status (1)

Country Link
JP (1) JPS5338266A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6188240U (en) * 1984-11-15 1986-06-09
JPS6224637A (en) * 1985-07-24 1987-02-02 Matsushita Electronics Corp Wafer making
JPH02254215A (en) * 1989-03-27 1990-10-15 Osaka Gas Co Ltd Household burner

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6188240U (en) * 1984-11-15 1986-06-09
JPS6224637A (en) * 1985-07-24 1987-02-02 Matsushita Electronics Corp Wafer making
JPH02254215A (en) * 1989-03-27 1990-10-15 Osaka Gas Co Ltd Household burner

Similar Documents

Publication Publication Date Title
JPS52106279A (en) Manufacture of semiconductor ic
JPS5338266A (en) Screening method of semiconductors and device for the same
JPS51121651A (en) Screw and its manufacturing method
JPS5210032A (en) Construction method of semiconductor memory unit
JPS51112193A (en) Processing method of semiconductor equipment
JPS51113572A (en) Centering method for electronic ray picture and the unit using the sai d method
JPS51126083A (en) Manufacturing method of semi-conductor equpment
JPS51137382A (en) Measuring method for junction point within semi conductor wafer
JPS538569A (en) Ic test method
JPS5245274A (en) Method for inspection before perfection of transistor
JPS51113665A (en) Method and apparatus of the selection of goods for testing
JPS53116075A (en) Chip coating method in electronic components
JPS5417667A (en) Selecting method for semiconductor device
JPS5216167A (en) Production method of semiconductor device
JPS5230275A (en) Apparatus for making fluorescent substance and paint
JPS51140638A (en) Positioning method
JPS51151071A (en) Manufacturing method of a semiconductor apparatus
JPS52140275A (en) Processing method for semiconductor wafer
JPS51138875A (en) Intermittent elmination
JPS51115777A (en) Manufacturing method of a semiconductor apparatus
JPS5219032A (en) Ic memory function testing method
JPS53121542A (en) Test method
JPS5219071A (en) Production method of semiconductor device
JPS51148375A (en) Mesuring method of specific characteristics of semicondutor element
JPS5397765A (en) Production of semiconductor device