JPS51148375A - Mesuring method of specific characteristics of semicondutor element - Google Patents

Mesuring method of specific characteristics of semicondutor element

Info

Publication number
JPS51148375A
JPS51148375A JP7257175A JP7257175A JPS51148375A JP S51148375 A JPS51148375 A JP S51148375A JP 7257175 A JP7257175 A JP 7257175A JP 7257175 A JP7257175 A JP 7257175A JP S51148375 A JPS51148375 A JP S51148375A
Authority
JP
Japan
Prior art keywords
specific characteristics
mesuring
semicondutor
semicondutor element
mesuring method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7257175A
Other languages
Japanese (ja)
Inventor
Yoshiaki Sano
Kazuya Takahashi
Akio Tazawa
Koji Iizuka
Nobuo Kawase
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP7257175A priority Critical patent/JPS51148375A/en
Publication of JPS51148375A publication Critical patent/JPS51148375A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To measure the whole number at the same time without sending a wafer and to make it possible to select inferior elements with no ink mark as well.
COPYRIGHT: (C)1976,JPO&Japio
JP7257175A 1975-06-14 1975-06-14 Mesuring method of specific characteristics of semicondutor element Pending JPS51148375A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7257175A JPS51148375A (en) 1975-06-14 1975-06-14 Mesuring method of specific characteristics of semicondutor element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7257175A JPS51148375A (en) 1975-06-14 1975-06-14 Mesuring method of specific characteristics of semicondutor element

Publications (1)

Publication Number Publication Date
JPS51148375A true JPS51148375A (en) 1976-12-20

Family

ID=13493180

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7257175A Pending JPS51148375A (en) 1975-06-14 1975-06-14 Mesuring method of specific characteristics of semicondutor element

Country Status (1)

Country Link
JP (1) JPS51148375A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS611036A (en) * 1984-06-13 1986-01-07 Internatl Rectifier Corp Japan Ltd Aligning method of semiconductor chip

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS611036A (en) * 1984-06-13 1986-01-07 Internatl Rectifier Corp Japan Ltd Aligning method of semiconductor chip
JPH02854B2 (en) * 1984-06-13 1990-01-09 Nippon Inter Electronics Corp

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