JPS5381084A - Testing method of integrated circuit - Google Patents

Testing method of integrated circuit

Info

Publication number
JPS5381084A
JPS5381084A JP15867476A JP15867476A JPS5381084A JP S5381084 A JPS5381084 A JP S5381084A JP 15867476 A JP15867476 A JP 15867476A JP 15867476 A JP15867476 A JP 15867476A JP S5381084 A JPS5381084 A JP S5381084A
Authority
JP
Japan
Prior art keywords
signals
integrated circuit
testing method
defective
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15867476A
Other languages
Japanese (ja)
Inventor
Hiroshi Takeda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP15867476A priority Critical patent/JPS5381084A/en
Publication of JPS5381084A publication Critical patent/JPS5381084A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE: To prevent backflow of signals to other ICs and test non-defective and defective without causing breakdown by applying signals to the input terminals of a printed circuit board, withdrawing the signals to the IC desired to be tested, making a reference signal output and comparing this signal and the output signals from the IC.
COPYRIGHT: (C)1978,JPO&Japio
JP15867476A 1976-12-27 1976-12-27 Testing method of integrated circuit Pending JPS5381084A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15867476A JPS5381084A (en) 1976-12-27 1976-12-27 Testing method of integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15867476A JPS5381084A (en) 1976-12-27 1976-12-27 Testing method of integrated circuit

Publications (1)

Publication Number Publication Date
JPS5381084A true JPS5381084A (en) 1978-07-18

Family

ID=15676877

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15867476A Pending JPS5381084A (en) 1976-12-27 1976-12-27 Testing method of integrated circuit

Country Status (1)

Country Link
JP (1) JPS5381084A (en)

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