JPS5381084A - Testing method of integrated circuit - Google Patents
Testing method of integrated circuitInfo
- Publication number
- JPS5381084A JPS5381084A JP15867476A JP15867476A JPS5381084A JP S5381084 A JPS5381084 A JP S5381084A JP 15867476 A JP15867476 A JP 15867476A JP 15867476 A JP15867476 A JP 15867476A JP S5381084 A JPS5381084 A JP S5381084A
- Authority
- JP
- Japan
- Prior art keywords
- signals
- integrated circuit
- testing method
- defective
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
PURPOSE: To prevent backflow of signals to other ICs and test non-defective and defective without causing breakdown by applying signals to the input terminals of a printed circuit board, withdrawing the signals to the IC desired to be tested, making a reference signal output and comparing this signal and the output signals from the IC.
COPYRIGHT: (C)1978,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15867476A JPS5381084A (en) | 1976-12-27 | 1976-12-27 | Testing method of integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15867476A JPS5381084A (en) | 1976-12-27 | 1976-12-27 | Testing method of integrated circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5381084A true JPS5381084A (en) | 1978-07-18 |
Family
ID=15676877
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15867476A Pending JPS5381084A (en) | 1976-12-27 | 1976-12-27 | Testing method of integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5381084A (en) |
-
1976
- 1976-12-27 JP JP15867476A patent/JPS5381084A/en active Pending
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO1988002490A1 (en) | Automatic test equipment for integrated circuits | |
JPS5381084A (en) | Testing method of integrated circuit | |
JPS5444480A (en) | Package for integrated circuit | |
JPS5627667A (en) | Method of estimating semiconductor device | |
JPS5727041A (en) | Large-scale integrated circuit having testing function | |
JPS5396740A (en) | Test system | |
JPS5750667A (en) | Inspecting device for printed circuit board | |
JPS5750666A (en) | Testing device for function of circuit | |
JPS5293361A (en) | Automatic tester | |
JPS5651677A (en) | Testing method | |
JPS5245234A (en) | Device for testing circuit | |
JPS574559A (en) | Testing method of integrated circuit | |
JPS53101951A (en) | Generating equipment for artificial trouble | |
JPS52122084A (en) | Inspection system for semiconductor substrates | |
JPS55107964A (en) | Device for evaluation of integrated circuit | |
JPS5232236A (en) | Testing device for interrupt processing circuit | |
JPS52144977A (en) | Inspecting method of semiconductor devices | |
JPS5399716A (en) | Clamp circuit | |
JPS56115965A (en) | Testing method for semiconductor integrated circuit device | |
JPS52134406A (en) | Test system for clock generator circuit | |
JPS5684570A (en) | Testing device for ic | |
JPS5297776A (en) | Tramcar circuit line insulation testing apparatus | |
JPS5380975A (en) | Test method for semiconductor integrated circuit device | |
JPS55113968A (en) | Method of testing integrated circuit | |
JPS5424555A (en) | Function test unit for logic circuit |