JPS5651677A - Testing method - Google Patents
Testing methodInfo
- Publication number
- JPS5651677A JPS5651677A JP12685579A JP12685579A JPS5651677A JP S5651677 A JPS5651677 A JP S5651677A JP 12685579 A JP12685579 A JP 12685579A JP 12685579 A JP12685579 A JP 12685579A JP S5651677 A JPS5651677 A JP S5651677A
- Authority
- JP
- Japan
- Prior art keywords
- signal
- pattern
- observed
- test
- logic circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE: To make it possible to make tests of variety by previously determining, pattern by pattern, whether an external terminal connected to input and output pins is applied with a signal or observed in a test and by making a test according to the determination.
CONSTITUTION: Interface 31 receives previously set-up test patterns and control information showing whether a terminal with input and output pins is applied with a signal or observed, and controller 32 controls the whole device and also compares the actual signal value of tested logic circuit 38 sent from receiver 36 to a preset expected signal to decide on rejection and acceptance. Table 33 is stored with pattern-by-pattern control signals showing whether the external terminal is applied with the signal or observed, and table 34 with test patterns to be supplied to tested logic circuit 38.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12685579A JPS5651677A (en) | 1979-10-03 | 1979-10-03 | Testing method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12685579A JPS5651677A (en) | 1979-10-03 | 1979-10-03 | Testing method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5651677A true JPS5651677A (en) | 1981-05-09 |
Family
ID=14945508
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12685579A Pending JPS5651677A (en) | 1979-10-03 | 1979-10-03 | Testing method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5651677A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5844366A (en) * | 1981-09-10 | 1983-03-15 | Fujitsu Ltd | Large-scale integrated circuit with reentry pin |
JPH04365711A (en) * | 1991-06-11 | 1992-12-17 | Nitto Seiko Co Ltd | Parts take-out device |
JPH0633819U (en) * | 1992-03-16 | 1994-05-06 | 車体工業株式会社 | Part take-out mechanism in assembly parts quantitative feeder |
-
1979
- 1979-10-03 JP JP12685579A patent/JPS5651677A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5844366A (en) * | 1981-09-10 | 1983-03-15 | Fujitsu Ltd | Large-scale integrated circuit with reentry pin |
JPH04365711A (en) * | 1991-06-11 | 1992-12-17 | Nitto Seiko Co Ltd | Parts take-out device |
JPH0633819U (en) * | 1992-03-16 | 1994-05-06 | 車体工業株式会社 | Part take-out mechanism in assembly parts quantitative feeder |
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