JPS54132172A - Detecting device for defective logic ic - Google Patents

Detecting device for defective logic ic

Info

Publication number
JPS54132172A
JPS54132172A JP4074278A JP4074278A JPS54132172A JP S54132172 A JPS54132172 A JP S54132172A JP 4074278 A JP4074278 A JP 4074278A JP 4074278 A JP4074278 A JP 4074278A JP S54132172 A JPS54132172 A JP S54132172A
Authority
JP
Japan
Prior art keywords
logic
initial setting
circuit
detecting device
standard logic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4074278A
Other languages
Japanese (ja)
Inventor
Katsuhiko Okamura
Toshio Maeda
Eihachi Yuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP4074278A priority Critical patent/JPS54132172A/en
Publication of JPS54132172A publication Critical patent/JPS54132172A/en
Pending legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE: To obtain a detecting device featuring an easy decision for the IC quality and thus to apply it to the automatic test by giving an forced initial setting to both the logic IC to be tested and standard logic IC via the initial setting circuit and then drawing the test result outside via the external control circuit.
CONSTITUTION: The input/output signal of tested logic IC element 10 which is applied the input signal and under the active state is applied to standard logic IC element 15 via connector 16. Element 15 can be replaced easily and contains standard logic IC element 11 featuring the same function as element 10, and the comparison signal is produced from element 11 to element 10. The comparison signal is then applied to comparator 12 to check the coincidence between the both elements for display on indicator 13. At the same time, the comparison result is sent to outside via external control circuit 17. In this case, element 10 containing the sequence circuit is decided nondefective. But the disagreement is sometimes given with the output signal of element 11. In this connection, both element 10 and 11 are set forcedly to the initial state via initial setting circuit 14.
COPYRIGHT: (C)1979,JPO&Japio
JP4074278A 1978-04-05 1978-04-05 Detecting device for defective logic ic Pending JPS54132172A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4074278A JPS54132172A (en) 1978-04-05 1978-04-05 Detecting device for defective logic ic

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4074278A JPS54132172A (en) 1978-04-05 1978-04-05 Detecting device for defective logic ic

Publications (1)

Publication Number Publication Date
JPS54132172A true JPS54132172A (en) 1979-10-13

Family

ID=12589076

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4074278A Pending JPS54132172A (en) 1978-04-05 1978-04-05 Detecting device for defective logic ic

Country Status (1)

Country Link
JP (1) JPS54132172A (en)

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