JPS55122170A - Method of measuring lag time of integrated circuit - Google Patents

Method of measuring lag time of integrated circuit

Info

Publication number
JPS55122170A
JPS55122170A JP2933779A JP2933779A JPS55122170A JP S55122170 A JPS55122170 A JP S55122170A JP 2933779 A JP2933779 A JP 2933779A JP 2933779 A JP2933779 A JP 2933779A JP S55122170 A JPS55122170 A JP S55122170A
Authority
JP
Japan
Prior art keywords
measured
input
output pins
lag times
stored
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2933779A
Other languages
Japanese (ja)
Other versions
JPH0235265B2 (en
Inventor
Ichiro Midorikawa
Yasunori Kanai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP2933779A priority Critical patent/JPS55122170A/en
Publication of JPS55122170A publication Critical patent/JPS55122170A/en
Publication of JPH0235265B2 publication Critical patent/JPH0235265B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Measurement Of Unknown Time Intervals (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE: To heighten measurement accuracy, by obtaining the compensated data of a standard sample from a value measured by a sampling oscilloscope and another value measured by a function LSI tester, and by compensating the measured value of a measured device by said compensated data.
CONSTITUTION: The input and output pins of a standard LSI sample 4 are connected to a sampling oscilloscope 7 and a function LSI tester 8. Lag times are measured in each test pattern with regard to each combination of the input and output pins. The measured lag times are stored on discs 9, 10. The difference between the lag times stored on the discs is calculated. Such calculated differences are stored as a compensation table showing a measured unit difference, on another disc 15. The input and output pins of a measured LSI13 are connected to the function tester 8. Lag times are measured in each test pattern with regard to each combination of the input and output pins of the measured LSI13. The measured lag times are compensated in each test pattern with regard to each combination of the input and output pins, by a compensator 16 on the basis of the compensation table stored on the disc 15.
COPYRIGHT: (C)1980,JPO&Japio
JP2933779A 1979-03-15 1979-03-15 Method of measuring lag time of integrated circuit Granted JPS55122170A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2933779A JPS55122170A (en) 1979-03-15 1979-03-15 Method of measuring lag time of integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2933779A JPS55122170A (en) 1979-03-15 1979-03-15 Method of measuring lag time of integrated circuit

Publications (2)

Publication Number Publication Date
JPS55122170A true JPS55122170A (en) 1980-09-19
JPH0235265B2 JPH0235265B2 (en) 1990-08-09

Family

ID=12273412

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2933779A Granted JPS55122170A (en) 1979-03-15 1979-03-15 Method of measuring lag time of integrated circuit

Country Status (1)

Country Link
JP (1) JPS55122170A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5859979A (en) * 1981-08-28 1983-04-09 バスフ　アクチェン　ゲゼルシャフト 2h-1,2,4,6-thiatriazine(3)one-1,1-dioxide, manufacture and herbicide containing same
JPS5940276A (en) * 1982-08-31 1984-03-05 Matsushita Electric Ind Co Ltd Apparatus for calculating collector loss
JPS5940275A (en) * 1982-08-31 1984-03-05 Matsushita Electric Ind Co Ltd Apparatus for calculating collector loss
US5499190A (en) * 1992-01-16 1996-03-12 Hamamatsu Photonics K.K. System for measuring timing relationship between two signals

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5317747U (en) * 1976-07-26 1978-02-15

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5317747U (en) * 1976-07-26 1978-02-15

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5859979A (en) * 1981-08-28 1983-04-09 バスフ　アクチェン　ゲゼルシャフト 2h-1,2,4,6-thiatriazine(3)one-1,1-dioxide, manufacture and herbicide containing same
JPS5940276A (en) * 1982-08-31 1984-03-05 Matsushita Electric Ind Co Ltd Apparatus for calculating collector loss
JPS5940275A (en) * 1982-08-31 1984-03-05 Matsushita Electric Ind Co Ltd Apparatus for calculating collector loss
JPH0429983B2 (en) * 1982-08-31 1992-05-20
US5499190A (en) * 1992-01-16 1996-03-12 Hamamatsu Photonics K.K. System for measuring timing relationship between two signals

Also Published As

Publication number Publication date
JPH0235265B2 (en) 1990-08-09

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