JPS5476074A - Inspection method for semiconductor integrated circuit - Google Patents

Inspection method for semiconductor integrated circuit

Info

Publication number
JPS5476074A
JPS5476074A JP14412677A JP14412677A JPS5476074A JP S5476074 A JPS5476074 A JP S5476074A JP 14412677 A JP14412677 A JP 14412677A JP 14412677 A JP14412677 A JP 14412677A JP S5476074 A JPS5476074 A JP S5476074A
Authority
JP
Japan
Prior art keywords
pattern
comparison
measuring
integrated circuit
semiconductor integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14412677A
Other languages
Japanese (ja)
Inventor
Atsushi Nigorikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP14412677A priority Critical patent/JPS5476074A/en
Publication of JPS5476074A publication Critical patent/JPS5476074A/en
Pending legal-status Critical Current

Links

Landscapes

  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE: To increase the processing ability, by measuring a plurality of IC's parallelly with one set of tester, discriminating them respectively and measuring the total with the measuring time for one piece's share.
CONSTITUTION: The test pattern 8 is generated 1, and it is parallelly fed to the measured IC's 2, 3 and the outputs 9, 10 are respectively given to the comparison circuits 4 and 5. The expectation pattern 11 is given to the circuits 4 and 5 from the pattern generating section 1, comparison is made with the timing of the strobe signal 14, and the information 12, 13 resulted from the comparison of each pattern are memorized in the registers 6, 7. When the content of the registers 6 and 7 is inspected after the end of test pattern, the propriety of IC's of a plurality can be judged. Thus, a plurality of IC's can be inspected with the inspection time for one piece and the processing ability can be increased.
COPYRIGHT: (C)1979,JPO&Japio
JP14412677A 1977-11-30 1977-11-30 Inspection method for semiconductor integrated circuit Pending JPS5476074A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14412677A JPS5476074A (en) 1977-11-30 1977-11-30 Inspection method for semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14412677A JPS5476074A (en) 1977-11-30 1977-11-30 Inspection method for semiconductor integrated circuit

Publications (1)

Publication Number Publication Date
JPS5476074A true JPS5476074A (en) 1979-06-18

Family

ID=15354794

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14412677A Pending JPS5476074A (en) 1977-11-30 1977-11-30 Inspection method for semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPS5476074A (en)

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