JPS5476074A - Inspection method for semiconductor integrated circuit - Google Patents
Inspection method for semiconductor integrated circuitInfo
- Publication number
- JPS5476074A JPS5476074A JP14412677A JP14412677A JPS5476074A JP S5476074 A JPS5476074 A JP S5476074A JP 14412677 A JP14412677 A JP 14412677A JP 14412677 A JP14412677 A JP 14412677A JP S5476074 A JPS5476074 A JP S5476074A
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- comparison
- measuring
- integrated circuit
- semiconductor integrated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Test And Diagnosis Of Digital Computers (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE: To increase the processing ability, by measuring a plurality of IC's parallelly with one set of tester, discriminating them respectively and measuring the total with the measuring time for one piece's share.
CONSTITUTION: The test pattern 8 is generated 1, and it is parallelly fed to the measured IC's 2, 3 and the outputs 9, 10 are respectively given to the comparison circuits 4 and 5. The expectation pattern 11 is given to the circuits 4 and 5 from the pattern generating section 1, comparison is made with the timing of the strobe signal 14, and the information 12, 13 resulted from the comparison of each pattern are memorized in the registers 6, 7. When the content of the registers 6 and 7 is inspected after the end of test pattern, the propriety of IC's of a plurality can be judged. Thus, a plurality of IC's can be inspected with the inspection time for one piece and the processing ability can be increased.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14412677A JPS5476074A (en) | 1977-11-30 | 1977-11-30 | Inspection method for semiconductor integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14412677A JPS5476074A (en) | 1977-11-30 | 1977-11-30 | Inspection method for semiconductor integrated circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5476074A true JPS5476074A (en) | 1979-06-18 |
Family
ID=15354794
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14412677A Pending JPS5476074A (en) | 1977-11-30 | 1977-11-30 | Inspection method for semiconductor integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5476074A (en) |
-
1977
- 1977-11-30 JP JP14412677A patent/JPS5476074A/en active Pending
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