JPS57191566A - Simple measuring method for resistance value - Google Patents
Simple measuring method for resistance valueInfo
- Publication number
- JPS57191566A JPS57191566A JP7697281A JP7697281A JPS57191566A JP S57191566 A JPS57191566 A JP S57191566A JP 7697281 A JP7697281 A JP 7697281A JP 7697281 A JP7697281 A JP 7697281A JP S57191566 A JPS57191566 A JP S57191566A
- Authority
- JP
- Japan
- Prior art keywords
- resistance
- voltmeter
- ammeter
- resistance value
- measuring method
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/14—Measuring resistance by measuring current or voltage obtained from a reference source
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
PURPOSE:To perform measurement easily without cutting a part of a closed circuit while the circuit is in operation, by connecting a voltmeter across a resistance to be measured in the closed circuit, and further connecting an ammeter across another resistance in the same closed circuit. CONSTITUTION:For the measurement of the resistance value of a resistance R1n, a voltmeter 1 having sufficiently high internal resistance is connected across the resistance R1n. Further, an ammeter 2 which has sufficiently low internal resistance is connected across a resistance R2n connected in series to the resistance R1n. When measured values of said voltmeter 1 and ammeter 2 are assumed to V volt and I ampere, then R1n=V/I(OMEGA) is obtained. Similarly, values of other resistances are measured respectively.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7697281A JPS57191566A (en) | 1981-05-21 | 1981-05-21 | Simple measuring method for resistance value |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7697281A JPS57191566A (en) | 1981-05-21 | 1981-05-21 | Simple measuring method for resistance value |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57191566A true JPS57191566A (en) | 1982-11-25 |
Family
ID=13620691
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7697281A Pending JPS57191566A (en) | 1981-05-21 | 1981-05-21 | Simple measuring method for resistance value |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57191566A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106124863A (en) * | 2016-09-01 | 2016-11-16 | 广东优科检测技术服务有限公司 | A kind of test circuit compensating resistance and method of testing |
-
1981
- 1981-05-21 JP JP7697281A patent/JPS57191566A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106124863A (en) * | 2016-09-01 | 2016-11-16 | 广东优科检测技术服务有限公司 | A kind of test circuit compensating resistance and method of testing |
CN106124863B (en) * | 2016-09-01 | 2019-03-26 | 广东优科检测技术服务有限公司 | A kind of test circuit and test method compensating resistance |
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