JPS524786A - Test method of integrated circuit - Google Patents

Test method of integrated circuit

Info

Publication number
JPS524786A
JPS524786A JP50080654A JP8065475A JPS524786A JP S524786 A JPS524786 A JP S524786A JP 50080654 A JP50080654 A JP 50080654A JP 8065475 A JP8065475 A JP 8065475A JP S524786 A JPS524786 A JP S524786A
Authority
JP
Japan
Prior art keywords
integrated circuit
test method
circuit
pin
ensure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP50080654A
Other languages
Japanese (ja)
Inventor
Akio Hori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP50080654A priority Critical patent/JPS524786A/en
Publication of JPS524786A publication Critical patent/JPS524786A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: To supply power source of specified voltage to IC pin through relay circuit and thus to ensure a simple and quick detection of bonding abnormality of IC circuit.
COPYRIGHT: (C)1977,JPO&Japio
JP50080654A 1975-06-30 1975-06-30 Test method of integrated circuit Pending JPS524786A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50080654A JPS524786A (en) 1975-06-30 1975-06-30 Test method of integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50080654A JPS524786A (en) 1975-06-30 1975-06-30 Test method of integrated circuit

Publications (1)

Publication Number Publication Date
JPS524786A true JPS524786A (en) 1977-01-14

Family

ID=13724338

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50080654A Pending JPS524786A (en) 1975-06-30 1975-06-30 Test method of integrated circuit

Country Status (1)

Country Link
JP (1) JPS524786A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50125836U (en) * 1974-03-30 1975-10-15
JPS63198881A (en) * 1987-01-16 1988-08-17 シーメンス、アクチエンゲゼルシヤフト Test apparatus for integrated circuit

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50125836U (en) * 1974-03-30 1975-10-15
JPS564970Y2 (en) * 1974-03-30 1981-02-03
JPS63198881A (en) * 1987-01-16 1988-08-17 シーメンス、アクチエンゲゼルシヤフト Test apparatus for integrated circuit

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