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Fujitsu Ltd
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Fujitsu Ltd
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Application filed by Fujitsu LtdfiledCriticalFujitsu Ltd
Priority to JP9583177ApriorityCriticalpatent/JPS5429983A/en
Publication of JPS5429983ApublicationCriticalpatent/JPS5429983A/en
Testing Of Individual Semiconductor Devices
(AREA)
Abstract
PURPOSE: To enable a voltage supply circuit to measure a MIS-type IC without using an oscillator, etc., by applying a voltage to the MIS-type IC only once and only by alternating a power voltage.
COPYRIGHT: (C)1979,JPO&Japio
JP9583177A1977-08-101977-08-10Testing method for mis semiconductor device
PendingJPS5429983A
(en)