JPS5384685A - Semicocductor element measuring method - Google Patents
Semicocductor element measuring methodInfo
- Publication number
- JPS5384685A JPS5384685A JP15922876A JP15922876A JPS5384685A JP S5384685 A JPS5384685 A JP S5384685A JP 15922876 A JP15922876 A JP 15922876A JP 15922876 A JP15922876 A JP 15922876A JP S5384685 A JPS5384685 A JP S5384685A
- Authority
- JP
- Japan
- Prior art keywords
- semicocductor
- measuring method
- element measuring
- paramaters
- measure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE: To measure the paramaters of an element in a short time by applying pulse voltage from a duty variable power source to the semiconductor element to be measured.
COPYRIGHT: (C)1978,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15922876A JPS5384685A (en) | 1976-12-30 | 1976-12-30 | Semicocductor element measuring method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15922876A JPS5384685A (en) | 1976-12-30 | 1976-12-30 | Semicocductor element measuring method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5384685A true JPS5384685A (en) | 1978-07-26 |
Family
ID=15689127
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15922876A Pending JPS5384685A (en) | 1976-12-30 | 1976-12-30 | Semicocductor element measuring method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5384685A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5835475A (en) * | 1981-08-28 | 1983-03-02 | Nippon Telegr & Teleph Corp <Ntt> | Measuring method for semiconductor device |
JPS6363979A (en) * | 1986-09-04 | 1988-03-22 | Hitachi Ltd | Method for aging semiconductor parts |
US6404219B1 (en) | 1998-12-07 | 2002-06-11 | Mitsubishi Denki Kabushiki Kaisha | Burn-in test method for a semiconductor chip and burn-in test apparatus therefor |
-
1976
- 1976-12-30 JP JP15922876A patent/JPS5384685A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5835475A (en) * | 1981-08-28 | 1983-03-02 | Nippon Telegr & Teleph Corp <Ntt> | Measuring method for semiconductor device |
JPS6363979A (en) * | 1986-09-04 | 1988-03-22 | Hitachi Ltd | Method for aging semiconductor parts |
US6404219B1 (en) | 1998-12-07 | 2002-06-11 | Mitsubishi Denki Kabushiki Kaisha | Burn-in test method for a semiconductor chip and burn-in test apparatus therefor |
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