JPS5245373A - Method of measuring forward voltage drop of semiconductor element - Google Patents

Method of measuring forward voltage drop of semiconductor element

Info

Publication number
JPS5245373A
JPS5245373A JP12063175A JP12063175A JPS5245373A JP S5245373 A JPS5245373 A JP S5245373A JP 12063175 A JP12063175 A JP 12063175A JP 12063175 A JP12063175 A JP 12063175A JP S5245373 A JPS5245373 A JP S5245373A
Authority
JP
Japan
Prior art keywords
semiconductor element
voltage drop
forward voltage
measuring forward
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12063175A
Other languages
Japanese (ja)
Inventor
Tatsuo Shimura
Takeshi Sasaki
Satoshi Mikami
Kunihiro Matsukuma
Mitsuo Sumiya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP12063175A priority Critical patent/JPS5245373A/en
Publication of JPS5245373A publication Critical patent/JPS5245373A/en
Pending legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: To apply a four-terminal measurement method on the metal films coated on both end faces of a semiconductor element. thereby effectively and highly accurately measuring forward voltage drop.
COPYRIGHT: (C)1977,JPO&Japio
JP12063175A 1975-10-08 1975-10-08 Method of measuring forward voltage drop of semiconductor element Pending JPS5245373A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12063175A JPS5245373A (en) 1975-10-08 1975-10-08 Method of measuring forward voltage drop of semiconductor element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12063175A JPS5245373A (en) 1975-10-08 1975-10-08 Method of measuring forward voltage drop of semiconductor element

Publications (1)

Publication Number Publication Date
JPS5245373A true JPS5245373A (en) 1977-04-09

Family

ID=14790993

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12063175A Pending JPS5245373A (en) 1975-10-08 1975-10-08 Method of measuring forward voltage drop of semiconductor element

Country Status (1)

Country Link
JP (1) JPS5245373A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4633175A (en) * 1984-11-23 1986-12-30 Avx Corporation Testing method and apparatus for electronic components

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4633175A (en) * 1984-11-23 1986-12-30 Avx Corporation Testing method and apparatus for electronic components

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