JPS5245373A - Method of measuring forward voltage drop of semiconductor element - Google Patents
Method of measuring forward voltage drop of semiconductor elementInfo
- Publication number
- JPS5245373A JPS5245373A JP12063175A JP12063175A JPS5245373A JP S5245373 A JPS5245373 A JP S5245373A JP 12063175 A JP12063175 A JP 12063175A JP 12063175 A JP12063175 A JP 12063175A JP S5245373 A JPS5245373 A JP S5245373A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor element
- voltage drop
- forward voltage
- measuring forward
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
PURPOSE: To apply a four-terminal measurement method on the metal films coated on both end faces of a semiconductor element. thereby effectively and highly accurately measuring forward voltage drop.
COPYRIGHT: (C)1977,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12063175A JPS5245373A (en) | 1975-10-08 | 1975-10-08 | Method of measuring forward voltage drop of semiconductor element |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12063175A JPS5245373A (en) | 1975-10-08 | 1975-10-08 | Method of measuring forward voltage drop of semiconductor element |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5245373A true JPS5245373A (en) | 1977-04-09 |
Family
ID=14790993
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12063175A Pending JPS5245373A (en) | 1975-10-08 | 1975-10-08 | Method of measuring forward voltage drop of semiconductor element |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5245373A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4633175A (en) * | 1984-11-23 | 1986-12-30 | Avx Corporation | Testing method and apparatus for electronic components |
-
1975
- 1975-10-08 JP JP12063175A patent/JPS5245373A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4633175A (en) * | 1984-11-23 | 1986-12-30 | Avx Corporation | Testing method and apparatus for electronic components |
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