JPS5390875A - Test equipment for semiconductor device - Google Patents

Test equipment for semiconductor device

Info

Publication number
JPS5390875A
JPS5390875A JP490777A JP490777A JPS5390875A JP S5390875 A JPS5390875 A JP S5390875A JP 490777 A JP490777 A JP 490777A JP 490777 A JP490777 A JP 490777A JP S5390875 A JPS5390875 A JP S5390875A
Authority
JP
Japan
Prior art keywords
semiconductor device
test equipment
warming
pulse
sending
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP490777A
Other languages
Japanese (ja)
Inventor
Hiroyuki Yoshimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP490777A priority Critical patent/JPS5390875A/en
Publication of JPS5390875A publication Critical patent/JPS5390875A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: To decrease the measurement time as well as to ensure an accurate characteristic test, by sending the device to the measurement station while warming up the device with the peripheral temperature and applying the voltage, current, pulse or the energy obtained through combination of them in order to maintain the device in the same state as the using condition.
COPYRIGHT: (C)1978,JPO&Japio
JP490777A 1977-01-21 1977-01-21 Test equipment for semiconductor device Pending JPS5390875A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP490777A JPS5390875A (en) 1977-01-21 1977-01-21 Test equipment for semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP490777A JPS5390875A (en) 1977-01-21 1977-01-21 Test equipment for semiconductor device

Publications (1)

Publication Number Publication Date
JPS5390875A true JPS5390875A (en) 1978-08-10

Family

ID=11596706

Family Applications (1)

Application Number Title Priority Date Filing Date
JP490777A Pending JPS5390875A (en) 1977-01-21 1977-01-21 Test equipment for semiconductor device

Country Status (1)

Country Link
JP (1) JPS5390875A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6281579A (en) * 1985-10-04 1987-04-15 Rohm Co Ltd Method for measuring electronic parts
JPS6358268A (en) * 1986-08-29 1988-03-14 Hitachi Electronics Eng Co Ltd Handler for component

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6281579A (en) * 1985-10-04 1987-04-15 Rohm Co Ltd Method for measuring electronic parts
JPS6358268A (en) * 1986-08-29 1988-03-14 Hitachi Electronics Eng Co Ltd Handler for component

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