JPS5626269A - Testing method of electric circuit - Google Patents

Testing method of electric circuit

Info

Publication number
JPS5626269A
JPS5626269A JP10291579A JP10291579A JPS5626269A JP S5626269 A JPS5626269 A JP S5626269A JP 10291579 A JP10291579 A JP 10291579A JP 10291579 A JP10291579 A JP 10291579A JP S5626269 A JPS5626269 A JP S5626269A
Authority
JP
Japan
Prior art keywords
circuit
pins
socket
artificial
substance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10291579A
Other languages
Japanese (ja)
Inventor
Shozo Toda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP10291579A priority Critical patent/JPS5626269A/en
Publication of JPS5626269A publication Critical patent/JPS5626269A/en
Pending legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE: To ensure a highly efficient test for the characteristics of the electric circuit part excluding the IC element, by attaching an artificial substance to the socket instead of the IC element.
CONSTITUTION: Electronic elements E1, E2... are put on print panel Pt with addition of signal input/output terminals T1, T2...Tm, Tn to form print panel unit to be tested. Instead of the IC, artificial substance R possessing the same arrangement of pins as the IC is attached to IC mounting socket C on the panel. Then a test is carried out. The circuit of substance R consists of input/output switching circuit I programable logic array L plus pins P1 ... Pn. These pins are inserted into the pin holes of the IC socket. The desired test can be given to the signal process via the artificial IC by forming properly the circuit constitution of circuit I and logic array L each according to the contents to be tested.
COPYRIGHT: (C)1981,JPO&Japio
JP10291579A 1979-08-13 1979-08-13 Testing method of electric circuit Pending JPS5626269A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10291579A JPS5626269A (en) 1979-08-13 1979-08-13 Testing method of electric circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10291579A JPS5626269A (en) 1979-08-13 1979-08-13 Testing method of electric circuit

Publications (1)

Publication Number Publication Date
JPS5626269A true JPS5626269A (en) 1981-03-13

Family

ID=14340144

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10291579A Pending JPS5626269A (en) 1979-08-13 1979-08-13 Testing method of electric circuit

Country Status (1)

Country Link
JP (1) JPS5626269A (en)

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