JPS6421374A - Apparatus for testing integrated circuit - Google Patents
Apparatus for testing integrated circuitInfo
- Publication number
- JPS6421374A JPS6421374A JP62178366A JP17836687A JPS6421374A JP S6421374 A JPS6421374 A JP S6421374A JP 62178366 A JP62178366 A JP 62178366A JP 17836687 A JP17836687 A JP 17836687A JP S6421374 A JPS6421374 A JP S6421374A
- Authority
- JP
- Japan
- Prior art keywords
- connector
- terminal
- change
- power source
- lsi
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE:To correspond to an LSI of every kind only by altering the insertion of an IC socket, by providing a connector to a board to be tested and further providing a switch for connecting the respective pins of the connector to either one of a power source, earth and a signal terminal. CONSTITUTION:A connector 3 is provided on a bard 1 to be tested composed of glass-epoxy and constituted so as to be capable of inserting various IC sockets 8. The respective pins of the connector 3 are connected to the common terminal of a change-over switch 5 by lead wires 4. The other terminal of the change-over switch is respectively connected to signal terminals 2 for connecting a VDD terminal 6 being a power source terminal, an earth terminal 7 and an LSI logical tester to obtain constitution making the selective change- over of them possible. By this method, the test to an LSI of every kind is performed by altering the insertion of the connector and, even when the position of a power source is different, measurement is made possible only by changing over the change-over switch on the board to be tested and the simplification of the apparatus is achieved.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62178366A JPS6421374A (en) | 1987-07-17 | 1987-07-17 | Apparatus for testing integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62178366A JPS6421374A (en) | 1987-07-17 | 1987-07-17 | Apparatus for testing integrated circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6421374A true JPS6421374A (en) | 1989-01-24 |
Family
ID=16047237
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62178366A Pending JPS6421374A (en) | 1987-07-17 | 1987-07-17 | Apparatus for testing integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6421374A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0543081U (en) * | 1991-03-25 | 1993-06-11 | エルエスアイ・ロジツク株式会社 | Prober attachment board |
JPH08254545A (en) * | 1995-02-03 | 1996-10-01 | Hewlett Packard Co <Hp> | Voltage probe of many leads |
CN106970250A (en) * | 2017-03-29 | 2017-07-21 | 上海航天科工电器研究院有限公司 | A kind of VPX data signals test device |
-
1987
- 1987-07-17 JP JP62178366A patent/JPS6421374A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0543081U (en) * | 1991-03-25 | 1993-06-11 | エルエスアイ・ロジツク株式会社 | Prober attachment board |
JPH08254545A (en) * | 1995-02-03 | 1996-10-01 | Hewlett Packard Co <Hp> | Voltage probe of many leads |
CN106970250A (en) * | 2017-03-29 | 2017-07-21 | 上海航天科工电器研究院有限公司 | A kind of VPX data signals test device |
CN106970250B (en) * | 2017-03-29 | 2019-06-04 | 上海航天科工电器研究院有限公司 | A kind of VPX digital signal test device |
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