JPS6421374A - Apparatus for testing integrated circuit - Google Patents

Apparatus for testing integrated circuit

Info

Publication number
JPS6421374A
JPS6421374A JP62178366A JP17836687A JPS6421374A JP S6421374 A JPS6421374 A JP S6421374A JP 62178366 A JP62178366 A JP 62178366A JP 17836687 A JP17836687 A JP 17836687A JP S6421374 A JPS6421374 A JP S6421374A
Authority
JP
Japan
Prior art keywords
connector
terminal
change
power source
lsi
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62178366A
Other languages
Japanese (ja)
Inventor
Noriaki Takagi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP62178366A priority Critical patent/JPS6421374A/en
Publication of JPS6421374A publication Critical patent/JPS6421374A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To correspond to an LSI of every kind only by altering the insertion of an IC socket, by providing a connector to a board to be tested and further providing a switch for connecting the respective pins of the connector to either one of a power source, earth and a signal terminal. CONSTITUTION:A connector 3 is provided on a bard 1 to be tested composed of glass-epoxy and constituted so as to be capable of inserting various IC sockets 8. The respective pins of the connector 3 are connected to the common terminal of a change-over switch 5 by lead wires 4. The other terminal of the change-over switch is respectively connected to signal terminals 2 for connecting a VDD terminal 6 being a power source terminal, an earth terminal 7 and an LSI logical tester to obtain constitution making the selective change- over of them possible. By this method, the test to an LSI of every kind is performed by altering the insertion of the connector and, even when the position of a power source is different, measurement is made possible only by changing over the change-over switch on the board to be tested and the simplification of the apparatus is achieved.
JP62178366A 1987-07-17 1987-07-17 Apparatus for testing integrated circuit Pending JPS6421374A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62178366A JPS6421374A (en) 1987-07-17 1987-07-17 Apparatus for testing integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62178366A JPS6421374A (en) 1987-07-17 1987-07-17 Apparatus for testing integrated circuit

Publications (1)

Publication Number Publication Date
JPS6421374A true JPS6421374A (en) 1989-01-24

Family

ID=16047237

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62178366A Pending JPS6421374A (en) 1987-07-17 1987-07-17 Apparatus for testing integrated circuit

Country Status (1)

Country Link
JP (1) JPS6421374A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0543081U (en) * 1991-03-25 1993-06-11 エルエスアイ・ロジツク株式会社 Prober attachment board
JPH08254545A (en) * 1995-02-03 1996-10-01 Hewlett Packard Co <Hp> Voltage probe of many leads
CN106970250A (en) * 2017-03-29 2017-07-21 上海航天科工电器研究院有限公司 A kind of VPX data signals test device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0543081U (en) * 1991-03-25 1993-06-11 エルエスアイ・ロジツク株式会社 Prober attachment board
JPH08254545A (en) * 1995-02-03 1996-10-01 Hewlett Packard Co <Hp> Voltage probe of many leads
CN106970250A (en) * 2017-03-29 2017-07-21 上海航天科工电器研究院有限公司 A kind of VPX data signals test device
CN106970250B (en) * 2017-03-29 2019-06-04 上海航天科工电器研究院有限公司 A kind of VPX digital signal test device

Similar Documents

Publication Publication Date Title
US4924179A (en) Method and apparatus for testing electronic devices
GB2281403B (en) Detecting faults on a printed circuit board
EP1451599A4 (en) Method and apparatus for embeded built-in self-test (bist) of electronic circuits and systems
CA2488832A1 (en) Multi-socket board for open/short tester
MY137464A (en) Method and apparatus for in-circuit testing of sockets
EP0280565A3 (en) Test socket incorporating circuit elements
MY112140A (en) Jig for measuring the characteristics of a semiconductor, manufacturing method for the same, and usage of the same
JPS6421374A (en) Apparatus for testing integrated circuit
US4152644A (en) Fixture for testing integrated circuits
US4491781A (en) Patch cord tester
KR200274849Y1 (en) The socket connecting structure of dut for testing the device
US3411072A (en) Test apparatus for indicating voltage and current conditions of plug-in components in their associated circuitry
KR930006962B1 (en) Semiconductor testing method
KR970028581A (en) Test board with changeable clock signal input terminal
JPH0720193A (en) Dut board
JPS6468667A (en) Test system for printed board
KR20050030253A (en) Interface device for jtag i/o test
JPS6415672A (en) Lsi testing apparatus
CN117572213A (en) Test structure and method applied to PCBA board card
JPH0334030B2 (en)
JPS5466778A (en) Ic board
JPS6488263A (en) In-circuit tester and manufacture of electronic apparatus using said tester
JPH04225167A (en) Wiring cable
JPH03135044A (en) Board for test use
JPS6469976A (en) Component having testing circuit incorporated