JPH0334030B2 - - Google Patents

Info

Publication number
JPH0334030B2
JPH0334030B2 JP59224503A JP22450384A JPH0334030B2 JP H0334030 B2 JPH0334030 B2 JP H0334030B2 JP 59224503 A JP59224503 A JP 59224503A JP 22450384 A JP22450384 A JP 22450384A JP H0334030 B2 JPH0334030 B2 JP H0334030B2
Authority
JP
Japan
Prior art keywords
flat cable
socket
sockets
attached
connectors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59224503A
Other languages
Japanese (ja)
Other versions
JPS61102565A (en
Inventor
Takashi Noguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP59224503A priority Critical patent/JPS61102565A/en
Publication of JPS61102565A publication Critical patent/JPS61102565A/en
Publication of JPH0334030B2 publication Critical patent/JPH0334030B2/ja
Granted legal-status Critical Current

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  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Description

【発明の詳細な説明】 [技術分野] 本発明は、フラツトケーブルの導通、耐圧検査
を行うことにより良否をチエツクするフラツトケ
ーブルテスタに関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field] The present invention relates to a flat cable tester that checks the quality of a flat cable by testing its continuity and withstand voltage.

[背景技術] 従来、フラツトケーブルの導通、耐圧検査を行
うことにより良否をチエツクするようにしたこの
種のフラツトケーブルテスタは、被検査フラツト
ケーブルの両端に取着されているコネクタの品種
に応じて専用の治具を使用するようになつてい
た。したがつて、フラツトケーブル1の両端のコ
ネクタのうち一方の形状(MILタイプ、デイツ
プタイプ、ICタイプ)やピン数(フラツトケー
ブルの芯数)が変わると治具を新しく作る必要が
あり、コネクタが異なつた多品種のフラツトケー
ブルに容易に対応できないという問題があつた。
第11図は両端にMILタイプのコネクタ2aが
取着されたフラツトケーブル1、第12図はデイ
ツプタイプのコネクタ2bが取着されたフラツト
ケーブル1、第13図はICタイプのコネクタ2
cが取着されたフラツトケーブル1、第14図は
一端にMILタイプのコネクタ2aが取着された
他端にICタイプのコネクタ2cが取着されたフ
ラツトケーブル1を示している。
[Background Art] Conventionally, this type of flat cable tester has been designed to check the quality of flat cables by conducting continuity and voltage proof tests. Special jigs have come to be used depending on the situation. Therefore, if the shape (MIL type, deep type, IC type) or number of pins (number of cores of the flat cable) of one of the connectors at both ends of the flat cable 1 changes, a new jig must be made, and the connector There was a problem in that it was not easy to accommodate a wide variety of flat cables with different characteristics.
Figure 11 shows a flat cable 1 with MIL type connectors 2a attached to both ends, Figure 12 shows a flat cable 1 with dip type connectors 2b attached, and Figure 13 shows an IC type connector 2.
Fig. 14 shows a flat cable 1 having a MIL type connector 2a attached to one end and an IC type connector 2c attached to the other end.

[発明の目的] 本発明は上記の点に鑑みて為されたものであ
り、その目的とするところは、コネクタが異なつ
た多品種のフラツトケーブルに容易に対応するこ
とができるフラツトケーブルテスタを提供するこ
とにある。
[Object of the Invention] The present invention has been made in view of the above points, and its object is to provide a flat cable tester that can easily handle various types of flat cables with different connectors. Our goal is to provide the following.

[発明の開示] (実施例) 第1図乃至第9図は本発明一実施例を示すもの
であり、フラツトケーブルテスタは、フラツトケ
ーブル1の両端に取着されたコネクタ2a〜2c
がそれぞれ接続されるソケツト3a〜3cを有
し、両ソケツト3a〜3cのピンに導通検査回路
4あるいは耐圧検査回路5を接続し、判定回路6
でフラツトケーブル1の良否をチエツクするよう
になつており、切換回路7,8は検査方法に応じ
て接続を切り換える回路であり、各回路4〜8の
動作はコントロール回路9にて制御されるように
なつている。芯数切り換え回路10は連動して切
り換えられるロータリスイツチSWa、SWbにて
形成され、芯数の異なつた(少ない)フラツトケ
ーブル1に対しても接続ピン数が同一のソケツト
3a〜3cで対応できるようにするものである。
ソケツトブロツク11a〜11cは各種コネクタ
2a〜2cに対応するソケツト3a〜3cがそれ
ぞれ基台12に取着されたものであり、これらの
ソケツトブロツク11a〜11cのうちの2個が
それぞれ着脱自在に装着されるソケツト装着部1
3,14が検査回路4,5が収納されたハウジン
グ15に設けられており、両ソケツト装着部1
3,14に装着されたソケツトブロツク11a〜
11cのソケツト3a〜3cにフラツトケーブル
1両端のコネクター2a〜2cをそれぞれ接続す
るようになつている。第3図および第4図は
MILタイプのコネクタ2aが接続されるソケツ
ト3aが基台12に取着されたソケツトブロツク
11aを示し、第5図および第6図はデイツプタ
イプのコネクタ2bが接続されるソケツト3bが
取着されたソケツトブロツク11bを示し、第7
図はICタイプのコネクタ2cが接続されるソケ
ツト3cが取着されたケツトブロツク11cを示
しており、各ソケツトブロツク11a〜11cの
着脱は把手16を持つて行えば良い。また、ソケ
ツト3a〜3cの各接続ピン17はプリント基板
18の導電パターン18aによつて第9図に示す
ように接続されており、フラツトケーブル1の芯
線1aが1つおきに直列接続されるようになつて
いる。したがつて、C、D端子を短絡してA、B
端子間の抵抗を導通検査回路4に測定すれば、フ
ラツトケーブル1の全芯線1aの導通検査が1回
の検査で行なわれるようになつている。また、
C、D端子をオープンにしてA、B端子間の耐圧
を耐圧検査回路5にて測定すれば、フラツトケー
ブル1の隣接する芯線1a間の耐圧検査が1回で
行なわれるようになつている。
[Disclosure of the Invention] (Embodiment) FIGS. 1 to 9 show an embodiment of the present invention, and a flat cable tester includes connectors 2a to 2c attached to both ends of a flat cable 1.
A continuity test circuit 4 or a withstand voltage test circuit 5 is connected to the pins of both sockets 3a to 3c, and a determination circuit 6 is connected to the pins of both sockets 3a to 3c.
The switching circuits 7 and 8 are circuits that switch connections according to the inspection method, and the operation of each circuit 4 to 8 is controlled by a control circuit 9. It's becoming like that. The number of cores switching circuit 10 is formed by rotary switches SWa and SWb that are switched in conjunction with each other, and the sockets 3a to 3c with the same number of connection pins can be used even for flat cables 1 with different (smaller) numbers of cores. It is intended to do so.
The socket blocks 11a to 11c have sockets 3a to 3c corresponding to the various connectors 2a to 2c attached to the base 12, respectively, and two of these socket blocks 11a to 11c are detachably attached to each socket. Socket mounting part 1
3 and 14 are provided in the housing 15 in which the test circuits 4 and 5 are housed, and both socket mounting parts 1
Socket block 11a attached to 3, 14~
The connectors 2a to 2c at both ends of the flat cable 1 are connected to the sockets 3a to 3c of the cable 11c, respectively. Figures 3 and 4 are
A socket block 11a is shown in which a socket 3a to which a MIL type connector 2a is connected is attached to the base 12, and FIGS. 5 and 6 show a socket block 11b to which a socket 3b to which a dip type connector 2b is attached is attached. and the seventh
The figure shows a socket block 11c fitted with a socket 3c to which an IC type connector 2c is connected, and each socket block 11a to 11c can be attached or detached by holding the handle 16. Further, the connection pins 17 of the sockets 3a to 3c are connected as shown in FIG. 9 by a conductive pattern 18a of the printed circuit board 18, and every other core wire 1a of the flat cable 1 is connected in series. It's becoming like that. Therefore, by shorting C and D terminals, A and B
If the resistance between the terminals is measured by the continuity test circuit 4, the continuity test of all the core wires 1a of the flat cable 1 can be performed in one test. Also,
By opening the C and D terminals and measuring the withstand voltage between the A and B terminals using the withstand voltage test circuit 5, the withstand voltage test between adjacent core wires 1a of the flat cable 1 can be performed in one go. .

以下、実施例の動作について説明する。いま、
例えば、第14図に示すフラツトケーブル1を検
査する場合、ハウジング15のソケツト装着部1
3,14には、被検査フラツトケーブル1の両端
のコネクタ2a,2cに対応するソケツト3a,
3cが取着されているソケツトブロツク11a,
11cを装着し、芯数切り換え回路10のロータ
リスイツチSWa,SWbにてフラツトケーブル1
の芯線1aの数を設定する。第9図においてa側
に切り換えれば10芯、b側に切り換えれば14
芯にセツトされるようになつており、実施例にお
けるソケツト3a〜3cの接続ピン数は14ピン
となつている。次に、検査手順は第10図のフロ
ーチヤートに示すように、まず、耐圧検査用印加
電圧および耐圧検査時間のセツト、導通検査レベ
ルのセツトなどの初期セツトを行い、被検査フラ
ツトケーブル1をセツト(コネクタ2a,2cを
ソケツト3a,3cに接続)し、検査をスタート
する。導通検査はC、D端子を短絡してA、B端
子間の抵抗が所定の値以下であるかをチエツク
し、良品であれば導通良品ランプを点灯し、不良
品であれば導通不良ランプを点灯するとともにブ
ザーを鳴動させて検査結果を報知する。続いて行
なわれる耐圧検査はC、D端子をオープンにして
A、B端子間に耐圧検査用の所定電圧を所定時間
印加し、耐圧が得られれば耐圧良品ランプを点灯
し、耐圧が得られなければ耐圧不良ランプを点灯
するとともにブザーを鳴動させて検査結果を報知
する。不良報知は検査者が認識した時点で適宜リ
セツトされ、両検査が終了した時点でフラツトケ
ーブル1が取り外される。同様にして他のフラツ
トケーブル1を検査する場合には、被検査フラツ
トケーブル1の両端のコネクタ2a〜2cに適合
するソケツト3a〜3cが取着されたソケツトブ
ロツク11a〜11cをソケツト装着部13,1
4に装着して、ロータリスイツチSWa,SWbに
よつて芯数をセツトすれば良く、両端に取着され
たコネクタ2a〜2cの異なつたフラツトケーブ
ル1の検査が容易にできるようになつている。こ
の場合、フラツトケーブル1の各端部のコネクタ
2a〜2cに適合するソケトブロツク11a〜1
1cをソケツト装着部13,14に独立して着脱
できるようになつているので、各ソケツトブロツ
ク11a〜11cをそれぞれ1対だけ用意してお
けば、異なつたコネクタ2a〜2cを任意に取着
したフラツトケーブル1の検査を行うことがで
き、6個のソケツトブロツク11a〜11cで多
品種のフラツトケーブル1に対応できることにな
る。
The operation of the embodiment will be described below. now,
For example, when inspecting the flat cable 1 shown in FIG.
3 and 14 have sockets 3a and 3a corresponding to the connectors 2a and 2c at both ends of the flat cable 1 to be inspected, respectively.
3c is attached to the socket block 11a,
11c, and use the rotary switches SWa and SWb of the number of cores switching circuit 10 to connect the flat cable 1.
Set the number of core wires 1a. In Figure 9, if you switch to the a side, there will be 10 cores, and if you switch to the b side, it will be 14 cores.
The sockets 3a to 3c in this embodiment have 14 connection pins. Next, as shown in the flowchart of FIG. 10, the inspection procedure first performs initial settings such as setting the applied voltage and withstand voltage test time for the withstand voltage test, and setting the continuity test level, and then sets the flat cable 1 to be tested. (connect connectors 2a, 2c to sockets 3a, 3c) and start testing. Continuity testing involves shorting C and D terminals and checking whether the resistance between A and B terminals is below a predetermined value. If the product is in good condition, a good continuity lamp is lit, and if it is defective, a poor continuity lamp is lit. It lights up and sounds a buzzer to notify you of the test results. The subsequent voltage test is performed by opening the C and D terminals and applying a specified voltage for the voltage test between the A and B terminals for a specified period of time, and if the voltage resistance is achieved, the good voltage lamp is turned on and the voltage resistance is confirmed. In this case, the test result is notified by lighting the voltage failure lamp and sounding the buzzer. The defect notification is reset as appropriate when the inspector recognizes it, and the flat cable 1 is removed when both inspections are completed. When inspecting another flat cable 1 in the same manner, the socket blocks 11a to 11c, to which the sockets 3a to 3c compatible with the connectors 2a to 2c at both ends of the flat cable 1 to be inspected are attached, are inserted into the socket mounting portion 13. ,1
4 and set the number of cores using rotary switches SWa and SWb, making it easy to inspect flat cables 1 with different connectors 2a to 2c attached to both ends. . In this case, socket blocks 11a to 11 that fit the connectors 2a to 2c at each end of the flat cable 1 are provided.
1c can be attached to and detached from the socket mounting portions 13 and 14 independently, so if only one pair of each socket block 11a to 11c is prepared, the socket blocks 1c can be attached to the socket blocks 11a to 11c independently, and different connectors 2a to 2c can be arbitrarily attached to the flanges. The flat cable 1 can be inspected, and the six socket blocks 11a to 11c can handle a wide variety of flat cables 1.

[発明の効果] 本発明は上述のように、フラツトケーブルの両
端に取着されたコネクタがそれぞれ接続されるソ
ケツトを有し、両ソケツトのピンに導通検査回路
あるいは耐圧検査回路を接続することによりフラ
ツトケーブルの良否をチエツクするようにして成
るフラツトケーブルテスタにおいて、各種コネク
タに対応するソケツトがそれぞれ基台に取着され
た複数種のソケツトブロツクを形成し、上記ソケ
ツトブロツクのうちの2個がそれぞれ着脱自在に
装着されるソケツト装着部を検査回路が収納され
たハウジングに設け、両ソケツトブロツクのソケ
ツトにフラツトケーブル両端のコネクタをそれぞ
れ接続するようにしたものであるので、ソケツト
装着部に装着されるソケツトブロツクを、被検査
フラツトケーブル両端のコネクタに対応したソケ
ツトが取着されたものに取り替えることによつて
コネクタが異なつた多品種のフラツトケーブルに
容易に対応することができるという効果がある。
[Effects of the Invention] As described above, the present invention has sockets to which the connectors attached to both ends of the flat cable are connected, and a continuity test circuit or voltage resistance test circuit is connected to the pins of both sockets. In this flat cable tester, sockets corresponding to various connectors form a plurality of types of socket blocks each attached to a base, and two of the socket blocks are A removably attached socket attachment part is provided in the housing housing the test circuit, and the connectors at both ends of the flat cable are connected to the sockets of both socket blocks. By replacing the socket block with a socket that corresponds to the connectors at both ends of the flat cable to be inspected, it is possible to easily handle a wide variety of flat cables with different connectors. .

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明一実施例の外観斜視図、第2図
は同上の分解斜視図、第3図乃至第7図は同上の
要部を示す図、第8図は同上のブロツク回路図、
第9図は同上の検査方法を示す図、第10図は同
上の動作説明図、第11図乃至第14図はフラツ
トケーブルを示す斜視図である。 1はフラツトケーブル、2a〜2cはコネク
タ、3a〜3cはソケツト、4は導通検査回路、
5は耐圧検査回路、11a〜11cはソケツトブ
ロツク、12は基台、13,14はソケツト装着
部、15はハウジングである。
FIG. 1 is an external perspective view of an embodiment of the present invention, FIG. 2 is an exploded perspective view of the same, FIGS. 3 to 7 are views showing the main parts of the same, and FIG. 8 is a block circuit diagram of the same.
FIG. 9 is a diagram showing the same inspection method as above, FIG. 10 is an explanatory diagram of the same operation, and FIGS. 11 to 14 are perspective views showing the flat cable. 1 is a flat cable, 2a to 2c are connectors, 3a to 3c are sockets, 4 is a continuity test circuit,
Reference numeral 5 designates a withstand voltage test circuit, 11a to 11c socket blocks, 12 a base, 13 and 14 socket attachment parts, and 15 a housing.

Claims (1)

【特許請求の範囲】[Claims] 1 フラツトケーブルの両端に取着されたコネク
タがそれぞれ接続されるソケツトを有し、両ソケ
ツトのピンに導通検査回路あるいは耐圧検査回路
を接続することによりフラツトケーブルの良否を
チエツクするようにして成るフラツトケーブルテ
スタにおいて、各種のコネクタに対応するソケツ
トがそれぞれ基台に取着された複数種のソケツト
ブロツクを形成し、上記ソケツトブロツクのうち
の2個がそれぞれ着脱自在に装着されるソケツト
装着部を検査回路が収納されたハウジングに設
け、両ソケツトブロツクのソケツトにフラツトケ
ーブル両端のコネクタをそれぞれ接続するように
したことを特徴とするフラツトケーブルテスタ。
1. The connectors attached to both ends of the flat cable have sockets to which they are connected, and the quality of the flat cable can be checked by connecting a continuity test circuit or voltage proof test circuit to the pins of both sockets. In this flat cable tester, sockets corresponding to various types of connectors form a plurality of types of socket blocks each attached to a base, and two of the socket blocks are each provided with a socket mounting part to which each socket block is detachably attached. A flat cable tester characterized in that the testing circuit is provided in a housing housing the test circuit, and the connectors at both ends of the flat cable are connected to the sockets of both socket blocks.
JP59224503A 1984-10-25 1984-10-25 Flat cable tester Granted JPS61102565A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59224503A JPS61102565A (en) 1984-10-25 1984-10-25 Flat cable tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59224503A JPS61102565A (en) 1984-10-25 1984-10-25 Flat cable tester

Publications (2)

Publication Number Publication Date
JPS61102565A JPS61102565A (en) 1986-05-21
JPH0334030B2 true JPH0334030B2 (en) 1991-05-21

Family

ID=16814815

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59224503A Granted JPS61102565A (en) 1984-10-25 1984-10-25 Flat cable tester

Country Status (1)

Country Link
JP (1) JPS61102565A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0433282A (en) * 1990-05-28 1992-02-04 Emiile Denshi Kaihatsushiya:Kk Electronic circuit multi-function block

Also Published As

Publication number Publication date
JPS61102565A (en) 1986-05-21

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