JPS55143458A - Testing device for logic unit - Google Patents

Testing device for logic unit

Info

Publication number
JPS55143458A
JPS55143458A JP12089378A JP12089378A JPS55143458A JP S55143458 A JPS55143458 A JP S55143458A JP 12089378 A JP12089378 A JP 12089378A JP 12089378 A JP12089378 A JP 12089378A JP S55143458 A JPS55143458 A JP S55143458A
Authority
JP
Japan
Prior art keywords
logic unit
tested
testing device
unit
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12089378A
Other languages
Japanese (ja)
Other versions
JPS6145790B2 (en
Inventor
Fumio Takahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP12089378A priority Critical patent/JPS55143458A/en
Publication of JPS55143458A publication Critical patent/JPS55143458A/en
Publication of JPS6145790B2 publication Critical patent/JPS6145790B2/ja
Granted legal-status Critical Current

Links

Abstract

PURPOSE: To perform the fault diagnosis and fault isolation of a tested logic circuit device in a short time by reducing the number of factors to be analyzed by performing the artificial operation of a peripheral equipment in a testing device.
CONSTITUTION: On the basis of an operation command from logic unit 2 to be tested, test operation is carried out and its operation result is supplied to tested logic unit 2 for artificial operation. In addition to the above-mentioned aritificail operation, two kinds of operation, the supply of a test operation command and test information to tested logic unit 2 and a comparison between the test result from unit 2 and a perviously-stored expected value are realized by logic-unit testing device 4.
COPYRIGHT: (C)1980,JPO&Japio
JP12089378A 1978-09-29 1978-09-29 Testing device for logic unit Granted JPS55143458A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12089378A JPS55143458A (en) 1978-09-29 1978-09-29 Testing device for logic unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12089378A JPS55143458A (en) 1978-09-29 1978-09-29 Testing device for logic unit

Publications (2)

Publication Number Publication Date
JPS55143458A true JPS55143458A (en) 1980-11-08
JPS6145790B2 JPS6145790B2 (en) 1986-10-09

Family

ID=14797589

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12089378A Granted JPS55143458A (en) 1978-09-29 1978-09-29 Testing device for logic unit

Country Status (1)

Country Link
JP (1) JPS55143458A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1989012273A1 (en) * 1988-05-30 1989-12-14 Fanuc Ltd Testing method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1989012273A1 (en) * 1988-05-30 1989-12-14 Fanuc Ltd Testing method

Also Published As

Publication number Publication date
JPS6145790B2 (en) 1986-10-09

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