JPS51147935A - Integrated circuit testing apparatus - Google Patents
Integrated circuit testing apparatusInfo
- Publication number
- JPS51147935A JPS51147935A JP50071762A JP7176275A JPS51147935A JP S51147935 A JPS51147935 A JP S51147935A JP 50071762 A JP50071762 A JP 50071762A JP 7176275 A JP7176275 A JP 7176275A JP S51147935 A JPS51147935 A JP S51147935A
- Authority
- JP
- Japan
- Prior art keywords
- integrated circuit
- testing apparatus
- circuit testing
- dut
- tester
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE: To improve the working efficiency of an IC tester by simultaneous measurement for a plurality of integrated circuits to be tested (hereinafter as DUT).
COPYRIGHT: (C)1976,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP50071762A JPS51147935A (en) | 1975-06-13 | 1975-06-13 | Integrated circuit testing apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP50071762A JPS51147935A (en) | 1975-06-13 | 1975-06-13 | Integrated circuit testing apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS51147935A true JPS51147935A (en) | 1976-12-18 |
Family
ID=13469865
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP50071762A Pending JPS51147935A (en) | 1975-06-13 | 1975-06-13 | Integrated circuit testing apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS51147935A (en) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4745548A (en) * | 1971-05-18 | 1972-12-25 | ||
JPS4932020A (en) * | 1972-07-28 | 1974-03-23 | ||
JPS4951830A (en) * | 1972-09-19 | 1974-05-20 |
-
1975
- 1975-06-13 JP JP50071762A patent/JPS51147935A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4745548A (en) * | 1971-05-18 | 1972-12-25 | ||
JPS4932020A (en) * | 1972-07-28 | 1974-03-23 | ||
JPS4951830A (en) * | 1972-09-19 | 1974-05-20 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5363961A (en) | Semiconductor integrated circuit | |
JPS5216178A (en) | Airtightness testing device | |
JPS51147935A (en) | Integrated circuit testing apparatus | |
JPS5440082A (en) | Semiconductor test device | |
JPS52122446A (en) | Circuit tester | |
JPS5322757A (en) | Testing apparatus of electric a ppliances | |
JPS53119642A (en) | Testing equipment for logic circuit | |
JPS53124080A (en) | Package mounted ic test equipment | |
JPS53144682A (en) | Testing method of semiconductor devices | |
JPS51147937A (en) | Logic circuit device | |
JPS5320981A (en) | Voltage-withstand tester | |
JPS5245234A (en) | Device for testing circuit | |
JPS5425786A (en) | Repeated bending tester | |
JPS5233482A (en) | Testing process of wafer characteristics | |
JPS5297776A (en) | Tramcar circuit line insulation testing apparatus | |
JPS5219079A (en) | Ic tester | |
JPS5232275A (en) | Wafer inspector | |
JPS52115188A (en) | Prober | |
JPS5240979A (en) | Apparatus for testing characteristics of semiconductor device | |
JPS51139270A (en) | Power supply circuit for functional module circuit tester | |
JPS5366005A (en) | Compressor testing device | |
JPS5232236A (en) | Testing device for interrupt processing circuit | |
JPS533277A (en) | Partial discharge tester | |
JPS52155065A (en) | Wafer insepaction method | |
JPS5291646A (en) | Array probe card for testing ic wafer |