JPS53124080A - Package mounted ic test equipment - Google Patents

Package mounted ic test equipment

Info

Publication number
JPS53124080A
JPS53124080A JP3930077A JP3930077A JPS53124080A JP S53124080 A JPS53124080 A JP S53124080A JP 3930077 A JP3930077 A JP 3930077A JP 3930077 A JP3930077 A JP 3930077A JP S53124080 A JPS53124080 A JP S53124080A
Authority
JP
Japan
Prior art keywords
test equipment
package mounted
faulty
tested
secure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3930077A
Other languages
Japanese (ja)
Inventor
Kyoji Tomita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP3930077A priority Critical patent/JPS53124080A/en
Publication of JPS53124080A publication Critical patent/JPS53124080A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: To secure a completely automatic analyzing action for the faulty IC by positioning the IC logic value reader at the mounting position of the tested IC.
COPYRIGHT: (C)1978,JPO&Japio
JP3930077A 1977-04-05 1977-04-05 Package mounted ic test equipment Pending JPS53124080A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3930077A JPS53124080A (en) 1977-04-05 1977-04-05 Package mounted ic test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3930077A JPS53124080A (en) 1977-04-05 1977-04-05 Package mounted ic test equipment

Publications (1)

Publication Number Publication Date
JPS53124080A true JPS53124080A (en) 1978-10-30

Family

ID=12549268

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3930077A Pending JPS53124080A (en) 1977-04-05 1977-04-05 Package mounted ic test equipment

Country Status (1)

Country Link
JP (1) JPS53124080A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5565162A (en) * 1978-11-10 1980-05-16 Nippon Precision Saakitsutsu Kk Wafer prober
JPS56173109U (en) * 1980-05-22 1981-12-21
US4651874A (en) * 1979-12-03 1987-03-24 Kenji Nakamura Re-sealable dispenser container
JPS62126781U (en) * 1986-01-10 1987-08-11

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5565162A (en) * 1978-11-10 1980-05-16 Nippon Precision Saakitsutsu Kk Wafer prober
JPS5950942B2 (en) * 1978-11-10 1984-12-11 日本プレシジヨン・サ−キツツ株式会社 wafer prober
US4651874A (en) * 1979-12-03 1987-03-24 Kenji Nakamura Re-sealable dispenser container
JPS56173109U (en) * 1980-05-22 1981-12-21
JPS5830495Y2 (en) * 1980-05-22 1983-07-05 憲司 中村 Cosmetic packaging bag
JPS62126781U (en) * 1986-01-10 1987-08-11

Similar Documents

Publication Publication Date Title
IT7926078A0 (en) EQUIPMENT FOR TESTING MACROSTRUCTURES ON LSI CHIPS.
JPS53124080A (en) Package mounted ic test equipment
JPS5441799A (en) Error checking device in punching machine
JPS5439576A (en) Inspection method for semiconductor device
JPS5386140A (en) Automatic altering device for priority
JPS5293361A (en) Automatic tester
JPS53119642A (en) Testing equipment for logic circuit
JPS52132777A (en) Ic pin number display method
JPS549846A (en) Tester for automibile electronic controller
JPS545632A (en) Test method for memory unit
JPS53107001A (en) Automatic testing device for vehicle
JPS5429539A (en) Test system for integrated circuit
JPS5389676A (en) Extracting method for non-defective or defective semiconductor pelletsbased on memory means
JPS5360169A (en) Semiconductor integrated circuit device
JPS5343451A (en) Data analyzer
JPS53130936A (en) Simple memory card tester
JPS51147937A (en) Logic circuit device
JPS522497A (en) Testing machine used for data collecting apparatus for cllecting selli ng data of automatic selling machine
JPS54280A (en) Positioning device
JPS52144921A (en) Clear circuit
JPS53100711A (en) Automatic call test equipment
JPS5350940A (en) Test method for display unit
JPS5366175A (en) Evaluation method for reliability of semiconductor unit
JPS5375741A (en) Test equipment for data processing unit
JPS53121542A (en) Test method