JPS5233482A - Testing process of wafer characteristics - Google Patents

Testing process of wafer characteristics

Info

Publication number
JPS5233482A
JPS5233482A JP10933875A JP10933875A JPS5233482A JP S5233482 A JPS5233482 A JP S5233482A JP 10933875 A JP10933875 A JP 10933875A JP 10933875 A JP10933875 A JP 10933875A JP S5233482 A JPS5233482 A JP S5233482A
Authority
JP
Japan
Prior art keywords
testing process
wafer characteristics
plural number
semiconductor chips
wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10933875A
Other languages
Japanese (ja)
Inventor
Tatsutoshi Sensui
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP10933875A priority Critical patent/JPS5233482A/en
Publication of JPS5233482A publication Critical patent/JPS5233482A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE: To reduce the measuring time of semiconductor wafer which is composed of a plural number of semiconductor chips, by testing a plural number of semiconductor chips at the same time with a plural number of probe cards.
COPYRIGHT: (C)1977,JPO&Japio
JP10933875A 1975-09-09 1975-09-09 Testing process of wafer characteristics Pending JPS5233482A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10933875A JPS5233482A (en) 1975-09-09 1975-09-09 Testing process of wafer characteristics

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10933875A JPS5233482A (en) 1975-09-09 1975-09-09 Testing process of wafer characteristics

Publications (1)

Publication Number Publication Date
JPS5233482A true JPS5233482A (en) 1977-03-14

Family

ID=14507684

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10933875A Pending JPS5233482A (en) 1975-09-09 1975-09-09 Testing process of wafer characteristics

Country Status (1)

Country Link
JP (1) JPS5233482A (en)

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