JPS5233482A - Testing process of wafer characteristics - Google Patents
Testing process of wafer characteristicsInfo
- Publication number
- JPS5233482A JPS5233482A JP10933875A JP10933875A JPS5233482A JP S5233482 A JPS5233482 A JP S5233482A JP 10933875 A JP10933875 A JP 10933875A JP 10933875 A JP10933875 A JP 10933875A JP S5233482 A JPS5233482 A JP S5233482A
- Authority
- JP
- Japan
- Prior art keywords
- testing process
- wafer characteristics
- plural number
- semiconductor chips
- wafer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE: To reduce the measuring time of semiconductor wafer which is composed of a plural number of semiconductor chips, by testing a plural number of semiconductor chips at the same time with a plural number of probe cards.
COPYRIGHT: (C)1977,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10933875A JPS5233482A (en) | 1975-09-09 | 1975-09-09 | Testing process of wafer characteristics |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10933875A JPS5233482A (en) | 1975-09-09 | 1975-09-09 | Testing process of wafer characteristics |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5233482A true JPS5233482A (en) | 1977-03-14 |
Family
ID=14507684
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10933875A Pending JPS5233482A (en) | 1975-09-09 | 1975-09-09 | Testing process of wafer characteristics |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5233482A (en) |
-
1975
- 1975-09-09 JP JP10933875A patent/JPS5233482A/en active Pending
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