ES8609738A1 - Una instalacion para comprobar circuitos electronicos fun- cionales - Google Patents

Una instalacion para comprobar circuitos electronicos fun- cionales

Info

Publication number
ES8609738A1
ES8609738A1 ES544433A ES544433A ES8609738A1 ES 8609738 A1 ES8609738 A1 ES 8609738A1 ES 544433 A ES544433 A ES 544433A ES 544433 A ES544433 A ES 544433A ES 8609738 A1 ES8609738 A1 ES 8609738A1
Authority
ES
Spain
Prior art keywords
circuitry
serializer
functional
functional electronic
electronic circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES544433A
Other languages
English (en)
Other versions
ES544433A0 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
UTI Corp
Original Assignee
UTI Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by UTI Corp filed Critical UTI Corp
Publication of ES8609738A1 publication Critical patent/ES8609738A1/es
Publication of ES544433A0 publication Critical patent/ES544433A0/es
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/2733—Test interface between tester and unit under test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

SISTEMA PARA COMPROBAR CIRCUITOS ELECTRONICOS FUNCIONALES. CONSTA DE: UNA PRIMERA SECCION (12) O SECCION DE PUNTOS DE CONTROL QUE TIENE, UN SEÑALIZADOR (21) DE PUNTO DE CONTROL QUE RECIBE UNA ENTRADA DE DATOS PROCEDENTES DE LA LINEA (22) (CPSDF) Y LA LINEA (23) (CPCLK), UNOS EXCITADORES DE SALIDA (24) CON LINEAS DE ENTRADA (26, 29) Y DE SALIDA (27) Y UN DECODIFICADOR/DEMULTIPLEXOR (28); UNA SEGUNDA SECCION O SECCION DE PUNTOS DE VISIBILIDAD (13) QUE TIENEN UNOS RECEPTORES (31) DE ENTRADA DE CARGA A LA UNIDAD DE LINEAS DE ENTRADA (32) DE DATOS DE VISIBILIDAD, UN SEÑALIZADOR (34) DE PUNTO DE VISIBILIDAD CON UNAS ENTRADAS DE (36) (VPLOAD) Y DE VPCLK (37) Y UNA SALIDA VPSD (38), UN CODIFICADOR/MULTIPLEXOR (39).
ES544433A 1984-06-27 1985-06-21 Una instalacion para comprobar circuitos electronicos fun- cionales Expired ES8609738A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/625,107 US4720672A (en) 1984-06-27 1984-06-27 Testability system

Publications (2)

Publication Number Publication Date
ES8609738A1 true ES8609738A1 (es) 1986-07-16
ES544433A0 ES544433A0 (es) 1986-07-16

Family

ID=24504615

Family Applications (1)

Application Number Title Priority Date Filing Date
ES544433A Expired ES8609738A1 (es) 1984-06-27 1985-06-21 Una instalacion para comprobar circuitos electronicos fun- cionales

Country Status (6)

Country Link
US (1) US4720672A (es)
EP (1) EP0166575B1 (es)
JP (1) JPS6117967A (es)
KR (1) KR860000564A (es)
DE (1) DE3579066D1 (es)
ES (1) ES8609738A1 (es)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4829520A (en) * 1987-03-16 1989-05-09 American Telephone And Telegraph Company, At&T Bell Laboratories In-place diagnosable electronic circuit board
DE3724847A1 (de) * 1987-07-27 1989-02-09 Siemens Ag Verfahren zur abspeicherung von fernmeldenachrichten
US4989209A (en) * 1989-03-24 1991-01-29 Motorola, Inc. Method and apparatus for testing high pin count integrated circuits
GB2251099B (en) * 1990-12-19 1994-08-03 Motorola Inc Bus system
DE4107172C2 (de) * 1991-03-06 1997-08-07 Siemens Ag Schaltungsanordnung zum Testen integrierter digitaler Schaltungen
US5270642A (en) * 1992-05-15 1993-12-14 Hewlett-Packard Company Partitioned boundary-scan testing for the reduction of testing-induced damage
US5627842A (en) * 1993-01-21 1997-05-06 Digital Equipment Corporation Architecture for system-wide standardized intra-module and inter-module fault testing
US5477545A (en) * 1993-02-09 1995-12-19 Lsi Logic Corporation Method and apparatus for testing of core-cell based integrated circuits
JP2967749B2 (ja) * 1997-03-07 1999-10-25 日本電気株式会社 テスト容易化論理合成システム
US6421810B1 (en) * 1999-05-05 2002-07-16 National Semiconductor Corporation Scalable parallel test bus and testing method
US7168021B2 (en) * 2005-02-01 2007-01-23 Taiwan Semiconductor Manufacturing Company, Ltd. Built-in test circuit for an integrated circuit device

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3919637A (en) * 1974-05-22 1975-11-11 Bell Telephone Labor Inc Logic circuit fault detector
CA1179730A (en) * 1982-06-16 1984-12-18 Marian Wiacek Snap-in sealing and insulating member for galvanic cells
EP0109770B1 (en) * 1982-11-20 1986-12-30 International Computers Limited Testing digital electronic circuits

Also Published As

Publication number Publication date
KR860000564A (ko) 1986-01-29
EP0166575B1 (en) 1990-08-08
US4720672A (en) 1988-01-19
EP0166575A2 (en) 1986-01-02
DE3579066D1 (de) 1990-09-13
EP0166575A3 (en) 1987-05-20
ES544433A0 (es) 1986-07-16
JPS6117967A (ja) 1986-01-25

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