JPS55157039A - Test system for logic unit - Google Patents

Test system for logic unit

Info

Publication number
JPS55157039A
JPS55157039A JP6464279A JP6464279A JPS55157039A JP S55157039 A JPS55157039 A JP S55157039A JP 6464279 A JP6464279 A JP 6464279A JP 6464279 A JP6464279 A JP 6464279A JP S55157039 A JPS55157039 A JP S55157039A
Authority
JP
Japan
Prior art keywords
test
circuit
lsi4
unit
adequacy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6464279A
Other languages
Japanese (ja)
Other versions
JPS6014377B2 (en
Inventor
Masaharu Tamai
Etsuo Shimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP54064642A priority Critical patent/JPS6014377B2/en
Publication of JPS55157039A publication Critical patent/JPS55157039A/en
Publication of JPS6014377B2 publication Critical patent/JPS6014377B2/en
Expired legal-status Critical Current

Links

Abstract

PURPOSE: To make easy the test of print board unit mounting complicated LSIs and to reduce the cost and time, by mounting a dummy logic circuit unit and performing a simulation test from the input and output terminal of logic unit.
CONSTITUTION: Considering that the adequacy of the entire print board unit 1 can practically and sufficiently be guaranteed (except the adequacy of LSI4 already proved) when only the adequacy of the peripheral circuits except LSI4 can be tested, the dummy circuit 4' having required and sufficient function only in testing the peripheral circuit is formed, it is mounted in place of the LSI4 for the test of the unit 1. The test data for the peripheral circuit assembling the circuit 4' can considerably be simplified in comparison with the test data for the circuit including LSI4 and sufficient test rate can be obtained.
COPYRIGHT: (C)1980,JPO&Japio
JP54064642A 1979-05-25 1979-05-25 Logical device test method Expired JPS6014377B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP54064642A JPS6014377B2 (en) 1979-05-25 1979-05-25 Logical device test method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP54064642A JPS6014377B2 (en) 1979-05-25 1979-05-25 Logical device test method

Publications (2)

Publication Number Publication Date
JPS55157039A true JPS55157039A (en) 1980-12-06
JPS6014377B2 JPS6014377B2 (en) 1985-04-12

Family

ID=13264116

Family Applications (1)

Application Number Title Priority Date Filing Date
JP54064642A Expired JPS6014377B2 (en) 1979-05-25 1979-05-25 Logical device test method

Country Status (1)

Country Link
JP (1) JPS6014377B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4744084A (en) * 1986-02-27 1988-05-10 Mentor Graphics Corporation Hardware modeling system and method for simulating portions of electrical circuits

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4744084A (en) * 1986-02-27 1988-05-10 Mentor Graphics Corporation Hardware modeling system and method for simulating portions of electrical circuits

Also Published As

Publication number Publication date
JPS6014377B2 (en) 1985-04-12

Similar Documents

Publication Publication Date Title
JPS51131240A (en) Electronic register
JPS55157039A (en) Test system for logic unit
JPS5444480A (en) Package for integrated circuit
JPS55108054A (en) Test system for synchronizing type digital circuit
JPS526436A (en) Electronic circuit test system
JPS5440049A (en) Information process system
JPS5395545A (en) Test method of electronic circuit
JPS55163699A (en) Testing system for memory board
JPS5419360A (en) Ic case with resistors
JPS52138849A (en) Logic integrated circuit
JPS5572261A (en) Logic unit
JPS5424555A (en) Function test unit for logic circuit
JPS53118327A (en) Automatic test data generator
JPS52113259A (en) Testing mechanism for electronic clock
JPS5296834A (en) Electronic computer
JPS53104135A (en) Timing test unit
JPS5563767A (en) Package with two stage terminal
JPS5422137A (en) Bus line chekcing device
JPS5235966A (en) Noise killer circuit for mos type integrated circuit
JPS51131237A (en) Electronic register
JPS5661664A (en) Testing device for operation of electronic circuit
JPS5582972A (en) Testing system of highly integrated circuit
JPS5349958A (en) Package tester
JPS5341953A (en) Lsi circuit
JPS5461438A (en) Information processor