JPS5582972A - Testing system of highly integrated circuit - Google Patents
Testing system of highly integrated circuitInfo
- Publication number
- JPS5582972A JPS5582972A JP15725178A JP15725178A JPS5582972A JP S5582972 A JPS5582972 A JP S5582972A JP 15725178 A JP15725178 A JP 15725178A JP 15725178 A JP15725178 A JP 15725178A JP S5582972 A JPS5582972 A JP S5582972A
- Authority
- JP
- Japan
- Prior art keywords
- simulation
- simulator
- output list
- integrated circuit
- testing system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE: To obtain an output list compact and readily visible by means of a simulation gate model provided on a simulator for reconnection of the input signal and the output signal of the bidirectional pin.
CONSTITUTION: When a simulation is made to verify the logic design of LSIs, with the switch signal SW turned to 0, to input signals IN and IPIN are given to simulate a model 1b. In this case, a simulator 9b outputs an output list to the line printer. The output list corresponds to the signals of the actual bidirectional pin one to one, hence compact and readily visible. When a simulation model is produced upon the end of the simulation for verifying the logic design, the switch signal SW is turned to 1 to actuate the simulator 9b for testing the LSI.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15725178A JPS5582972A (en) | 1978-12-19 | 1978-12-19 | Testing system of highly integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15725178A JPS5582972A (en) | 1978-12-19 | 1978-12-19 | Testing system of highly integrated circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5582972A true JPS5582972A (en) | 1980-06-23 |
Family
ID=15645547
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15725178A Pending JPS5582972A (en) | 1978-12-19 | 1978-12-19 | Testing system of highly integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5582972A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6847926B1 (en) * | 1999-10-29 | 2005-01-25 | Stmicroelectronics Limited | Method of distinguishing bidirectional pins |
-
1978
- 1978-12-19 JP JP15725178A patent/JPS5582972A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6847926B1 (en) * | 1999-10-29 | 2005-01-25 | Stmicroelectronics Limited | Method of distinguishing bidirectional pins |
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