JPS57206063A - Semiconductor substrate and manufacture therefor - Google Patents
Semiconductor substrate and manufacture thereforInfo
- Publication number
- JPS57206063A JPS57206063A JP56090936A JP9093681A JPS57206063A JP S57206063 A JPS57206063 A JP S57206063A JP 56090936 A JP56090936 A JP 56090936A JP 9093681 A JP9093681 A JP 9093681A JP S57206063 A JPS57206063 A JP S57206063A
- Authority
- JP
- Japan
- Prior art keywords
- type
- formation
- region
- layer
- diffused
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 title abstract 4
- 239000004065 semiconductor Substances 0.000 title abstract 2
- 238000004519 manufacturing process Methods 0.000 title 1
- 230000015572 biosynthetic process Effects 0.000 abstract 4
- 239000012535 impurity Substances 0.000 abstract 2
- 238000009792 diffusion process Methods 0.000 abstract 1
- 150000002500 ions Chemical class 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
- H01L21/822—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
- H01L21/8248—Combination of bipolar and field-effect technology
- H01L21/8249—Bipolar and MOS technology
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/0611—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region
- H01L27/0617—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region comprising components of the field-effect type
- H01L27/0623—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region comprising components of the field-effect type in combination with bipolar transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
- H01L27/085—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
- H01L27/088—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate
- H01L27/092—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate complementary MIS field-effect transistors
- H01L27/0921—Means for preventing a bipolar, e.g. thyristor, action between the different transistor regions, e.g. Latchup prevention
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Bipolar Transistors (AREA)
- Element Separation (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Abstract
PURPOSE:To build a P and N islands separated from each other by a method wherein an opposite condutivity type layer is buried in a semicondcutor substrate and a semiconductor region of the same conductivity type is formed therein for the formation of a diffused region reaching the buried layer from the semiconcutor region primary surface. CONSTITUTION:An N type impurity is diffused into a P type substrate 3-1 of 10<14>-10<17>cm<-3> concentration with a patterned heat oxidized film 3-2 acting as a mask for the formation of a buried layer 3-3 with a sheet resistance of 3- 20OMEGA/mm.<2>. After the removal of the film 3-2, on the whole substrate surface a P type epitaxial layers 3-4 are grown with an impurity concentration 10<14>- 10<16>cm<-3>. P ions are implanted into the epitaxial layer 3-4 for the formation of a diffusion source 3-7. P is thermally diffused in an inert atmosphere for the formation of an N type well region 3-5 adjoining the buried layer 3-3. A P channel MOS is formed in the N type well region 3-5 and an N channel MOS in the P type epitaxial layers 3-4.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56090936A JPS57206063A (en) | 1981-06-15 | 1981-06-15 | Semiconductor substrate and manufacture therefor |
EP82302987A EP0067661A1 (en) | 1981-06-15 | 1982-06-09 | Semiconductor device and method for manufacturing the same |
DE8419430U DE8419430U1 (en) | 1981-06-15 | 1984-06-28 | Snap hinge made of plastic |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56090936A JPS57206063A (en) | 1981-06-15 | 1981-06-15 | Semiconductor substrate and manufacture therefor |
DE8419430U DE8419430U1 (en) | 1981-06-15 | 1984-06-28 | Snap hinge made of plastic |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57206063A true JPS57206063A (en) | 1982-12-17 |
Family
ID=25949967
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56090936A Pending JPS57206063A (en) | 1981-06-15 | 1981-06-15 | Semiconductor substrate and manufacture therefor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57206063A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61220453A (en) * | 1985-03-23 | 1986-09-30 | エステイーシー ピーエルシー | Integrated circuit and manufacture thereof |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5214388A (en) * | 1975-07-25 | 1977-02-03 | Hitachi Ltd | Process for complementary insulated gate semiconductor integrated circuit device |
JPS5239380A (en) * | 1975-09-25 | 1977-03-26 | Mitsubishi Electric Corp | Semiconductor device |
JPS5493981A (en) * | 1978-01-09 | 1979-07-25 | Toshiba Corp | Semiconductor device |
JPS56169359A (en) * | 1980-05-30 | 1981-12-26 | Ricoh Co Ltd | Semiconductor integrated circuit device |
-
1981
- 1981-06-15 JP JP56090936A patent/JPS57206063A/en active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5214388A (en) * | 1975-07-25 | 1977-02-03 | Hitachi Ltd | Process for complementary insulated gate semiconductor integrated circuit device |
JPS5239380A (en) * | 1975-09-25 | 1977-03-26 | Mitsubishi Electric Corp | Semiconductor device |
JPS5493981A (en) * | 1978-01-09 | 1979-07-25 | Toshiba Corp | Semiconductor device |
JPS56169359A (en) * | 1980-05-30 | 1981-12-26 | Ricoh Co Ltd | Semiconductor integrated circuit device |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61220453A (en) * | 1985-03-23 | 1986-09-30 | エステイーシー ピーエルシー | Integrated circuit and manufacture thereof |
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