JPS56500991A - - Google Patents
Info
- Publication number
- JPS56500991A JPS56500991A JP50199280A JP50199280A JPS56500991A JP S56500991 A JPS56500991 A JP S56500991A JP 50199280 A JP50199280 A JP 50199280A JP 50199280 A JP50199280 A JP 50199280A JP S56500991 A JPS56500991 A JP S56500991A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/012—Manufacture or treatment of static induction transistors [SIT], e.g. permeable base transistors [PBT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02387—Group 13/15 materials
- H01L21/02395—Arsenides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02532—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02538—Group 13/15 materials
- H01L21/02546—Arsenides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/02636—Selective deposition, e.g. simultaneous growth of mono- and non-monocrystalline semiconductor materials
- H01L21/02639—Preparation of substrate for selective deposition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/74—Making of localized buried regions, e.g. buried collector layers, internal connections substrate contacts
- H01L21/743—Making of internal connections, substrate contacts
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/482—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body (electrodes)
- H01L23/4824—Pads with extended contours, e.g. grid structure, branch structure, finger structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/535—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including internal interconnections, e.g. cross-under constructions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D1/00—Resistors, capacitors or inductors
- H10D1/60—Capacitors
- H10D1/68—Capacitors having no potential barriers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/202—FETs having static field-induced regions, e.g. static-induction transistors [SIT] or permeable base transistors [PBT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/3011—Impedance
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/164—Three dimensional processing
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Bipolar Transistors (AREA)
- Junction Field-Effect Transistors (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US06/065,514 US4378629A (en) | 1979-08-10 | 1979-08-10 | Semiconductor embedded layer technology including permeable base transistor, fabrication method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS56500991A true JPS56500991A (OSRAM) | 1981-07-16 |
Family
ID=22063261
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50199280A Pending JPS56500991A (OSRAM) | 1979-08-10 | 1980-08-07 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US4378629A (OSRAM) |
| EP (1) | EP0034166B1 (OSRAM) |
| JP (1) | JPS56500991A (OSRAM) |
| CA (1) | CA1165011A (OSRAM) |
| DE (1) | DE3071962D1 (OSRAM) |
| WO (1) | WO1981000489A1 (OSRAM) |
Families Citing this family (59)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5515275A (en) * | 1978-07-19 | 1980-02-02 | Semiconductor Res Found | Charge transfer device |
| US4409725A (en) * | 1980-10-16 | 1983-10-18 | Nippon Gakki Seizo Kabushiki Kaisha | Method of making semiconductor integrated circuit |
| JPS57173978A (en) * | 1981-04-21 | 1982-10-26 | Nippon Gakki Seizo Kk | Integrated circuit device |
| FR2514949A1 (fr) * | 1981-10-16 | 1983-04-22 | Thomson Csf | Transistor a effet de champ a canal vertical |
| JPS5874083A (ja) * | 1981-10-28 | 1983-05-04 | Seiko Instr & Electronics Ltd | Mis集積回路とその製造方法 |
| JPS5894218A (ja) * | 1981-11-30 | 1983-06-04 | Semiconductor Res Found | フオトカツプラ |
| US4546375A (en) * | 1982-06-24 | 1985-10-08 | Rca Corporation | Vertical IGFET with internal gate and method for making same |
| US4495511A (en) * | 1982-08-23 | 1985-01-22 | The United States Of America As Represented By The Secretary Of The Navy | Permeable base transistor structure |
| JPS59108462A (ja) * | 1982-12-14 | 1984-06-22 | Olympus Optical Co Ltd | 静電誘導トランジスタを具える固体撮像素子 |
| US4522661A (en) * | 1983-06-24 | 1985-06-11 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Low defect, high purity crystalline layers grown by selective deposition |
| US4612072A (en) * | 1983-06-24 | 1986-09-16 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Method for growing low defect, high purity crystalline layers utilizing lateral overgrowth of a patterned mask |
| US4507158A (en) * | 1983-08-12 | 1985-03-26 | Hewlett-Packard Co. | Trench isolated transistors in semiconductor films |
| DE3345212A1 (de) * | 1983-12-14 | 1985-06-27 | Telefunken electronic GmbH, 7100 Heilbronn | Unipolartransistor |
| JPH0779159B2 (ja) * | 1984-03-22 | 1995-08-23 | 潤一 西澤 | 光トリガ・光クエンチ可能なサイリスタ装置 |
| JPS61121369A (ja) * | 1984-11-19 | 1986-06-09 | Fujitsu Ltd | 半導体装置 |
| US4901121A (en) * | 1985-03-29 | 1990-02-13 | American Telephone & Telegraph Co., At&T Bell Labs. | Semiconductor device comprising a perforated metal silicide layer |
| US4785340A (en) * | 1985-03-29 | 1988-11-15 | Director-General Of The Agency Of Industrial Science And Technology | Semiconductor device having doping multilayer structure |
| US4651407A (en) * | 1985-05-08 | 1987-03-24 | Gte Laboratories Incorporated | Method of fabricating a junction field effect transistor utilizing epitaxial overgrowth and vertical junction formation |
| US4677451A (en) * | 1985-05-24 | 1987-06-30 | Hughes Aircraft Company | Vertical channel field effect transistor |
| US4735918A (en) * | 1985-05-24 | 1988-04-05 | Hughes Aircraft Company | Vertical channel field effect transistor |
| US4758534A (en) * | 1985-11-13 | 1988-07-19 | Bell Communications Research, Inc. | Process for producing porous refractory metal layers embedded in semiconductor devices |
| US4641164A (en) * | 1986-05-30 | 1987-02-03 | Rca Corporation | Bidirectional vertical power MOS device and fabrication method |
| US4700460A (en) * | 1986-05-30 | 1987-10-20 | Rca Corporation | Method for fabricating bidirectional vertical power MOS device |
| US5016074A (en) * | 1987-10-20 | 1991-05-14 | Bell Communications Research, Inc. | Epitaxial intermetallic contact for compound semiconductors |
| US5155561A (en) * | 1988-01-05 | 1992-10-13 | Massachusetts Institute Of Technology | Permeable base transistor having an electrode configuration for heat dissipation |
| US5106778A (en) * | 1988-02-02 | 1992-04-21 | Massachusetts Institute Of Technology | Vertical transistor device fabricated with semiconductor regrowth |
| US4903089A (en) * | 1988-02-02 | 1990-02-20 | Massachusetts Institute Of Technology | Vertical transistor device fabricated with semiconductor regrowth |
| JPH03505861A (ja) * | 1988-06-03 | 1991-12-19 | マサチューセッツ・インステチュート・オブ・テクノロジー | ダイヤモンド上の二酸化ケイ素フィルム |
| GB8814365D0 (en) * | 1988-06-16 | 1988-07-20 | Marconi Gec Ltd | Optical devices |
| US4904980A (en) * | 1988-08-19 | 1990-02-27 | Westinghouse Electric Corp. | Refractory resistors with etch stop for superconductor integrated circuits |
| US5002899A (en) * | 1988-09-30 | 1991-03-26 | Massachusetts Institute Of Technology | Electrical contacts on diamond |
| WO1990007796A1 (en) * | 1989-01-03 | 1990-07-12 | Massachusetts Institute Of Technology | Insulator films on diamond |
| US5207863A (en) * | 1990-04-06 | 1993-05-04 | Canon Kabushiki Kaisha | Crystal growth method and crystalline article obtained by said method |
| JPH03290975A (ja) * | 1990-04-09 | 1991-12-20 | Fujitsu Ltd | 縦型半導体装置 |
| DE4019231A1 (de) * | 1990-06-15 | 1991-12-19 | Forschungszentrum Juelich Gmbh | Verfahren zur herstellung eines elektronischen bauelements und elektronisches bauelement |
| US5371378A (en) * | 1992-06-08 | 1994-12-06 | Kobe Steel Usa, Inc. | Diamond metal base/permeable base transistor and method of making same |
| FR2803433B1 (fr) * | 1999-12-30 | 2003-02-14 | Thomson Csf | Procede de realisation d'une grille metallique enterree dans une structure en materiau semiconducteur |
| US6706402B2 (en) * | 2001-07-25 | 2004-03-16 | Nantero, Inc. | Nanotube films and articles |
| US6643165B2 (en) * | 2001-07-25 | 2003-11-04 | Nantero, Inc. | Electromechanical memory having cell selection circuitry constructed with nanotube technology |
| US7566478B2 (en) * | 2001-07-25 | 2009-07-28 | Nantero, Inc. | Methods of making carbon nanotube films, layers, fabrics, ribbons, elements and articles |
| US6911682B2 (en) | 2001-12-28 | 2005-06-28 | Nantero, Inc. | Electromechanical three-trace junction devices |
| US6919592B2 (en) * | 2001-07-25 | 2005-07-19 | Nantero, Inc. | Electromechanical memory array using nanotube ribbons and method for making same |
| US6574130B2 (en) | 2001-07-25 | 2003-06-03 | Nantero, Inc. | Hybrid circuit having nanotube electromechanical memory |
| US6924538B2 (en) * | 2001-07-25 | 2005-08-02 | Nantero, Inc. | Devices having vertically-disposed nanofabric articles and methods of making the same |
| US7259410B2 (en) * | 2001-07-25 | 2007-08-21 | Nantero, Inc. | Devices having horizontally-disposed nanofabric articles and methods of making the same |
| US6835591B2 (en) * | 2001-07-25 | 2004-12-28 | Nantero, Inc. | Methods of nanotube films and articles |
| US7176505B2 (en) * | 2001-12-28 | 2007-02-13 | Nantero, Inc. | Electromechanical three-trace junction devices |
| US6784028B2 (en) | 2001-12-28 | 2004-08-31 | Nantero, Inc. | Methods of making electromechanical three-trace junction devices |
| US7335395B2 (en) | 2002-04-23 | 2008-02-26 | Nantero, Inc. | Methods of using pre-formed nanotubes to make carbon nanotube films, layers, fabrics, ribbons, elements and articles |
| US6774052B2 (en) * | 2002-06-19 | 2004-08-10 | Nantero, Inc. | Method of making nanotube permeable base transistor |
| AU2003248713A1 (en) * | 2002-06-19 | 2004-01-06 | Nantero, Inc. | Nanotube permeable base transistor and method of making same |
| US6759693B2 (en) | 2002-06-19 | 2004-07-06 | Nantero, Inc. | Nanotube permeable base transistor |
| US7162909B2 (en) * | 2002-08-28 | 2007-01-16 | Daniels Manufacturing Corporation | Crimp tool for crimping pin and socket contacts |
| US7560136B2 (en) * | 2003-01-13 | 2009-07-14 | Nantero, Inc. | Methods of using thin metal layers to make carbon nanotube films, layers, fabrics, ribbons, elements and articles |
| US6800496B1 (en) * | 2003-08-20 | 2004-10-05 | Taiwan Semiconductor Manufacturing Co., Ltd. | Characterization methodology for the thin gate oxide device |
| JP4791023B2 (ja) * | 2004-11-08 | 2011-10-12 | インターナショナル・ビジネス・マシーンズ・コーポレーション | Tftの検査装置および検査方法 |
| US7528065B2 (en) * | 2006-01-17 | 2009-05-05 | International Business Machines Corporation | Structure and method for MOSFET gate electrode landing pad |
| AU2008203209A1 (en) * | 2007-07-20 | 2009-02-05 | Gallium Enterprises Pty Ltd | Buried contact devices for nitride-base films and manufacture thereof |
| TWI566446B (zh) | 2013-11-20 | 2017-01-11 | 財團法人工業技術研究院 | 表面彈性波產生裝置、收發裝置及其產生方法 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5074384A (OSRAM) * | 1973-11-01 | 1975-06-19 | ||
| JPS5390774A (en) * | 1977-01-19 | 1978-08-09 | Handotai Kenkyu Shinkokai | Ic |
| JPS5482178A (en) * | 1977-12-14 | 1979-06-30 | Semiconductor Res Found | Electrostatic inductive intergrated circuit device |
Family Cites Families (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2524033A (en) * | 1948-02-26 | 1950-10-03 | Bell Telephone Labor Inc | Three-electrode circuit element utilizing semiconductive materials |
| US2569347A (en) * | 1948-06-26 | 1951-09-25 | Bell Telephone Labor Inc | Circuit element utilizing semiconductive material |
| US2820154A (en) * | 1954-11-15 | 1958-01-14 | Rca Corp | Semiconductor devices |
| NL264215A (OSRAM) * | 1960-05-02 | |||
| BE622805A (OSRAM) * | 1961-09-25 | |||
| FR1317256A (fr) * | 1961-12-16 | 1963-02-08 | Teszner Stanislas | Perfectionnements aux dispositifs semi-conducteurs dits tecnetrons multibâtonnets |
| US3250967A (en) * | 1961-12-22 | 1966-05-10 | Rca Corp | Solid state triode |
| GB948239A (en) * | 1962-05-15 | 1964-01-29 | Clevite Corp | Method of embedding a metallic grid in a body of semiconductive material |
| US3372069A (en) * | 1963-10-22 | 1968-03-05 | Texas Instruments Inc | Method for depositing a single crystal on an amorphous film, method for manufacturing a metal base transistor, and a thin-film, metal base transistor |
| US3386864A (en) * | 1963-12-09 | 1968-06-04 | Ibm | Semiconductor-metal-semiconductor structure |
| US3381189A (en) * | 1964-08-18 | 1968-04-30 | Hughes Aircraft Co | Mesa multi-channel field-effect triode |
| US3375418A (en) * | 1964-09-15 | 1968-03-26 | Sprague Electric Co | S-m-s device with partial semiconducting layers |
| DE1514457A1 (de) | 1965-05-03 | 1969-10-16 | Siemens Ag | Halbleiteranordnung mit wenigstens einem UEbergang zwischen einem Halbleiter und einem Metall |
| US3394289A (en) * | 1965-05-26 | 1968-07-23 | Sprague Electric Co | Small junction area s-m-s transistor |
| CH436492A (de) * | 1965-10-21 | 1967-05-31 | Bbc Brown Boveri & Cie | Steuerbare Halbleitervorrichtung mit mehreren Schichten |
| US3322581A (en) * | 1965-10-24 | 1967-05-30 | Texas Instruments Inc | Fabrication of a metal base transistor |
| US3425879A (en) * | 1965-10-24 | 1969-02-04 | Texas Instruments Inc | Method of making shaped epitaxial deposits |
| US3401449A (en) * | 1965-10-24 | 1968-09-17 | Texas Instruments Inc | Method of fabricating a metal base transistor |
| US3497777A (en) * | 1967-06-13 | 1970-02-24 | Stanislas Teszner | Multichannel field-effect semi-conductor device |
| US3597270A (en) * | 1968-08-15 | 1971-08-03 | Trw Inc | Inverted solid state diode |
| US3582410A (en) * | 1969-07-11 | 1971-06-01 | North American Rockwell | Process for producing metal base semiconductor devices |
| US3676732A (en) * | 1969-09-08 | 1972-07-11 | Columbia Broadcasting Syst Inc | Photo-electronic imaging apparatus |
| US3614560A (en) * | 1969-12-30 | 1971-10-19 | Ibm | Improved surface barrier transistor |
| BE791929A (fr) * | 1971-12-02 | 1973-03-16 | Western Electric Co | Procede de fabrication de regions isolantes dans un corps de semi-conducteur |
| US3751723A (en) * | 1972-03-01 | 1973-08-07 | Sprague Electric Co | Hot carrier metal base transistor having a p-type emitter and an n-type collector |
| US3860946A (en) * | 1972-10-13 | 1975-01-14 | California Inst Of Techn | Space-charge-limited solid-state triode |
| US3929527A (en) * | 1974-06-11 | 1975-12-30 | Us Army | Molecular beam epitaxy of alternating metal-semiconductor films |
| US4059461A (en) * | 1975-12-10 | 1977-11-22 | Massachusetts Institute Of Technology | Method for improving the crystallinity of semiconductor films by laser beam scanning and the products thereof |
| US3999281A (en) * | 1976-01-16 | 1976-12-28 | The United States Of America As Represented By The Secretary Of The Air Force | Method for fabricating a gridded Schottky barrier field effect transistor |
| DE2703877C2 (de) * | 1977-01-31 | 1982-06-03 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | MIS-Transistor von kurzer Kanallänge und Verfahren zu seiner Herstellung |
| US4170019A (en) * | 1977-08-05 | 1979-10-02 | General Electric Company | Semiconductor device with variable grid openings for controlling turn-off pattern |
| US4127861A (en) * | 1977-09-26 | 1978-11-28 | International Business Machines Corporation | Metal base transistor with thin film amorphous semiconductors |
-
1979
- 1979-08-10 US US06/065,514 patent/US4378629A/en not_active Expired - Lifetime
-
1980
- 1980-08-06 CA CA000357666A patent/CA1165011A/en not_active Expired
- 1980-08-07 DE DE8080901688T patent/DE3071962D1/de not_active Expired
- 1980-08-07 JP JP50199280A patent/JPS56500991A/ja active Pending
- 1980-08-07 WO PCT/US1980/000997 patent/WO1981000489A1/en not_active Ceased
-
1981
- 1981-02-24 EP EP80901688A patent/EP0034166B1/en not_active Expired
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5074384A (OSRAM) * | 1973-11-01 | 1975-06-19 | ||
| JPS5390774A (en) * | 1977-01-19 | 1978-08-09 | Handotai Kenkyu Shinkokai | Ic |
| JPS5482178A (en) * | 1977-12-14 | 1979-06-30 | Semiconductor Res Found | Electrostatic inductive intergrated circuit device |
Also Published As
| Publication number | Publication date |
|---|---|
| WO1981000489A1 (en) | 1981-02-19 |
| EP0034166B1 (en) | 1987-04-29 |
| EP0034166A4 (en) | 1984-04-27 |
| US4378629A (en) | 1983-04-05 |
| DE3071962D1 (en) | 1987-06-04 |
| EP0034166A1 (en) | 1981-08-26 |
| CA1165011A (en) | 1984-04-03 |