JPS5277671A - Method and equipment of masking - Google Patents

Method and equipment of masking

Info

Publication number
JPS5277671A
JPS5277671A JP50154448A JP15444875A JPS5277671A JP S5277671 A JPS5277671 A JP S5277671A JP 50154448 A JP50154448 A JP 50154448A JP 15444875 A JP15444875 A JP 15444875A JP S5277671 A JPS5277671 A JP S5277671A
Authority
JP
Japan
Prior art keywords
masking
equipment
spreaded
photoresist
exposing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP50154448A
Other languages
English (en)
Inventor
Kiyokatsu Jinno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP50154448A priority Critical patent/JPS5277671A/ja
Publication of JPS5277671A publication Critical patent/JPS5277671A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
    • G03F7/70866—Environment aspects, e.g. pressure of beam-path gas, temperature of mask or workpiece
    • G03F7/70875—Temperature, e.g. temperature control of masks or workpieces via control of stage temperature

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Atmospheric Sciences (AREA)
  • Toxicology (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP50154448A 1975-12-24 1975-12-24 Method and equipment of masking Pending JPS5277671A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50154448A JPS5277671A (en) 1975-12-24 1975-12-24 Method and equipment of masking

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50154448A JPS5277671A (en) 1975-12-24 1975-12-24 Method and equipment of masking

Publications (1)

Publication Number Publication Date
JPS5277671A true JPS5277671A (en) 1977-06-30

Family

ID=15584421

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50154448A Pending JPS5277671A (en) 1975-12-24 1975-12-24 Method and equipment of masking

Country Status (1)

Country Link
JP (1) JPS5277671A (ja)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55103736A (en) * 1979-02-01 1980-08-08 Toshiba Corp Hardening method of proving ink for semiconductor wafer
JPS58112329A (ja) * 1981-12-26 1983-07-04 Fujitsu Ltd Ｘ線露光方法
JPS59124140A (ja) * 1982-12-29 1984-07-18 Fujitsu Ltd 静電吸着装置
JPS59181622A (ja) * 1983-03-31 1984-10-16 Fujitsu Ltd 半導体装置の製造方法

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55103736A (en) * 1979-02-01 1980-08-08 Toshiba Corp Hardening method of proving ink for semiconductor wafer
JPS628937B2 (ja) * 1979-02-01 1987-02-25 Tokyo Shibaura Electric Co
JPS58112329A (ja) * 1981-12-26 1983-07-04 Fujitsu Ltd Ｘ線露光方法
JPS59124140A (ja) * 1982-12-29 1984-07-18 Fujitsu Ltd 静電吸着装置
JPS59181622A (ja) * 1983-03-31 1984-10-16 Fujitsu Ltd 半導体装置の製造方法

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